Thim Films Modules Characterization Under Standard Test Conditions

Muñoz-García, Miguel Angel; Marín González, Omar; Alonso Garcia, M. Carmen y Chenlo, Faustino (2010). Thim Films Modules Characterization Under Standard Test Conditions. En: "25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion,", 6-10 September 1009, Valencia, Spain, Valencia. ISBN 3-936338-26-4.

Descripción

Título: Thim Films Modules Characterization Under Standard Test Conditions
Autor/es:
  • Muñoz-García, Miguel Angel
  • Marín González, Omar
  • Alonso Garcia, M. Carmen
  • Chenlo, Faustino
Tipo de Documento: Ponencia en Congreso o Jornada (Póster)
Título del Evento: 25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion,
Fechas del Evento: 6-10 September 1009, Valencia, Spain
Lugar del Evento: Valencia
Título del Libro: Proceedings of the International Conference
Fecha: 6 Septiembre 2010
ISBN: 3-936338-26-4
Materias:
Palabras Clave Informales: CIEMAT, PVlabder, ReGENERA, Photovoltaics, thin film
Escuela: E.U.I.T. Agrícolas (UPM)
Departamento: Ingeniería Rural [hasta 2014]
Licencias Creative Commons: Ninguna

Texto completo

[img]
Vista Previa
PDF (Document Portable Format) - Se necesita un visor de ficheros PDF, como GSview, Xpdf o Adobe Acrobat Reader
Descargar (411kB) | Vista Previa

Resumen

Photovoltaic modules based on the relatively new thin film technology are gaining importance in the photovoltaic market. Some of these modules are made of silicon, consisting of layers of amorphous silicon or microcrystalline silicon. Other thin film PV modules are made of CIS, Cadmium Telluride (CdTe) or less frequently organic compounds. The materials used in thin film technologies pose problems in terms of measuring how much power is generated under standard test conditions (STC). This is due to the fact that the modules´ power rates could vary depending both on the amount of time they have been exposed to the sun and on their history of sunlight exposure. So it is necessary to know the previous periods of sunlight exposure in order to know the current state of the module. It is necessary to determine an easily accomplishable testing method that ensures the repeatability of the measurements of the power generated. This is essential because in order to have a reliable sample of the PV module population of a large PV plant, a huge number of modules must be measured. This paper shows different tests performed on different commercial thin film PV modules in order to find the best way to obtain measurements. A correlation was tested between sun exposure and power measured. A method for obtaining indoor measurements of these technologies that takes periods of sunlight exposure into account is proposed. Additionally, temperature and irradiance coefficients were also determined for different technologies in order to obtain accurate measurements.

Más información

ID de Registro: 10093
Identificador DC: http://oa.upm.es/10093/
Identificador OAI: oai:oa.upm.es:10093
Depositado por: Profesor Titular de Universidad (interino) Miguel Angel /M.A. Muñoz-García
Depositado el: 01 Feb 2012 08:32
Ultima Modificación: 20 Abr 2016 18:21
  • Open Access
  • Open Access
  • Sherpa-Romeo
    Compruebe si la revista anglosajona en la que ha publicado un artículo permite también su publicación en abierto.
  • Dulcinea
    Compruebe si la revista española en la que ha publicado un artículo permite también su publicación en abierto.
  • Recolecta
  • e-ciencia
  • Observatorio I+D+i UPM
  • OpenCourseWare UPM