Recrystallization of amorphous nano-tracks and uniform layers generated by swift-ion-beam irradiation in lithium niobate.

Crespillo Almenara, Miguel; Caballero Calero, O.; Joco, V.; Rivera de Mena, Antonio; Herrero, P.; Olivares Roza, Jimena y Agullo Lopez, Fernando (2011). Recrystallization of amorphous nano-tracks and uniform layers generated by swift-ion-beam irradiation in lithium niobate.. "Applied Physics A", v. 104 (n. 4); pp. 1143-1152. ISSN 0947-8396. https://doi.org/10.1007/s00339-011-6391-3.

Descripción

Título: Recrystallization of amorphous nano-tracks and uniform layers generated by swift-ion-beam irradiation in lithium niobate.
Autor/es:
  • Crespillo Almenara, Miguel
  • Caballero Calero, O.
  • Joco, V.
  • Rivera de Mena, Antonio
  • Herrero, P.
  • Olivares Roza, Jimena
  • Agullo Lopez, Fernando
Tipo de Documento: Artículo
Título de Revista/Publicación: Applied Physics A
Fecha: Septiembre 2011
Volumen: 104
Materias:
Escuela: E.T.S.I. Industriales (UPM)
Departamento: Ingeniería Nuclear [hasta 2014]
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

The thermal annealing of amorphous tracks of nanometer-size diameter generated in lithium niobate (LiNbO3) by Bromine ions at 45 MeV, i.e., in the electronic stopping regime, has been investigated by RBS/C spectrometry in the temperature range from 250°C to 350°C. Relatively low fluences have been used (<1012 cm−2) to produce isolated tracks. However, the possible effect of track overlapping has been investigated by varying the fluence between 3×1011 cm−2 and 1012 cm−2. The annealing process follows a two-step kinetics. In a first stage (I) the track radius decreases linearly with the annealing time. It obeys an Arrhenius-type dependence on annealing temperature with activation energy around 1.5 eV. The second stage (II) operates after the track radius has decreased down to around 2.5 nm and shows a much lower radial velocity. The data for stage I appear consistent with a solid-phase epitaxial process that yields a constant recrystallization rate at the amorphous-crystalline boundary. HRTEM has been used to monitor the existence and the size of the annealed isolated tracks in the second stage. On the other hand, the thermal annealing of homogeneous (buried) amorphous layers has been investigated within the same temperature range, on samples irradiated with Fluorine at 20 MeV and fluences of ∼1014 cm−2. Optical techniques are very suitable for this case and have been used to monitor the recrystallization of the layers. The annealing process induces a displacement of the crystalline-amorphous boundary that is also linear with annealing time, and the recrystallization rates are consistent with those measured for tracks. The comparison of these data with those previously obtained for the heavily damaged (amorphous) layers produced by elastic nuclear collisions is summarily discussed.

Más información

ID de Registro: 11402
Identificador DC: http://oa.upm.es/11402/
Identificador OAI: oai:oa.upm.es:11402
Identificador DOI: 10.1007/s00339-011-6391-3
URL Oficial: http://www.springerlink.com/content/f4378795rw571144/
Depositado por: Memoria Investigacion
Depositado el: 25 Jul 2012 12:02
Ultima Modificación: 20 Abr 2016 19:29
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