XPS as Characterization Tool for PV: From the Substrate to Complete III-V Multijunction Solar Cells

Gabás, M. and López-Escalante, M.C. and Algora del Valle, Carlos and Rey-Stolle Prado, Ignacio and Barrigón Montañés, Enrique and García Vara, Iván and Galiana Blanco, Beatriz and Palanco, S. and Bijani, S. and Ramos-Barrado, J.R. (2011). XPS as Characterization Tool for PV: From the Substrate to Complete III-V Multijunction Solar Cells. In: "37th IEEE Photovoltaic Specialists Conference, PVSC-2011", 19/06/2011 - 24/06/2011, Seattle, EEUU. ISBN 978-1-4244-9966-3. pp. 229-233.

Description

Title: XPS as Characterization Tool for PV: From the Substrate to Complete III-V Multijunction Solar Cells
Author/s:
  • Gabás, M.
  • López-Escalante, M.C.
  • Algora del Valle, Carlos
  • Rey-Stolle Prado, Ignacio
  • Barrigón Montañés, Enrique
  • García Vara, Iván
  • Galiana Blanco, Beatriz
  • Palanco, S.
  • Bijani, S.
  • Ramos-Barrado, J.R.
Item Type: Presentation at Congress or Conference (Article)
Event Title: 37th IEEE Photovoltaic Specialists Conference, PVSC-2011
Event Dates: 19/06/2011 - 24/06/2011
Event Location: Seattle, EEUU
Title of Book: Proceedings of the 37th IEEE Photovoltaic Specialists Conference, PVSC-2011
Date: 2011
ISBN: 978-1-4244-9966-3
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

This contribution aims to illustrate the potential of the X-ray photoelectron spectroscopy (XPS) technique as a tool to analyze different parts of a solar cell (surface state, heterointerfaces, profile composition of ohmic contacts, etc). Here, the analysis is specifically applied to III-V multijunction solar cells used in concentrator systems. The information provided from such XPS analysis has helped to understand the physico-chemical nature of these surfaces and interfaces, and thus has guided the technological process in order to improve the solar cell performance.

More information

Item ID: 12522
DC Identifier: http://oa.upm.es/12522/
OAI Identifier: oai:oa.upm.es:12522
Official URL: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6177424
Deposited by: Memoria Investigacion
Deposited on: 07 Aug 2012 10:00
Last Modified: 23 Feb 2015 16:02
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