Evidence of charge carrier number fluctuations in InN thin films?

Rani Mutta, Geeta and Guillet, Bruno and Mechim, Laurence and Vilalta Clemente, Arantxa and Grandal Quintana, Javier and Sánchez García, Miguel Angel and Martin Horcajo, Sara and Calle Gómez, Fernando (2011). Evidence of charge carrier number fluctuations in InN thin films?. In: "21st International Conference on Noise and Fluctuations", 12/06/2011 - 16/06/2011, Toronto, EEUU. ISBN 978-1-4577-0189-4. pp..

Description

Title: Evidence of charge carrier number fluctuations in InN thin films?
Author/s:
  • Rani Mutta, Geeta
  • Guillet, Bruno
  • Mechim, Laurence
  • Vilalta Clemente, Arantxa
  • Grandal Quintana, Javier
  • Sánchez García, Miguel Angel
  • Martin Horcajo, Sara
  • Calle Gómez, Fernando
Item Type: Presentation at Congress or Conference (Article)
Event Title: 21st International Conference on Noise and Fluctuations
Event Dates: 12/06/2011 - 16/06/2011
Event Location: Toronto, EEUU
Title of Book: Proceedings of 21st International Conference on Noise and Fluctuations
Date: 2011
ISBN: 978-1-4577-0189-4
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Ingeniería Electrónica
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Due to its small band-gap and its high mobility, InN is a promising material for a large number of key applications like band-gap engineering for high efficiency solar cells, light emitting diodes, and high speed devices. Unfortunately, it has been reported that this material exhibits strong surface charge accumulation which may depend on the type of surface. Current investigations are conducted in order to explain the mechanisms which govern such a behavior and to look for ways of avoiding it and/or finding applications that may use such an effect. In this framework, low frequency noise measurements have been performed at different temperatures on patterned MBE grown InN layers. The evolution of the 1/f noise level with temperature in the 77 K-300 K range is consistent with carrier number fluctuations thus indicating surface mechanisms: the surface charge accumulation is confirmed by the noise measurements.

More information

Item ID: 12919
DC Identifier: http://oa.upm.es/12919/
OAI Identifier: oai:oa.upm.es:12919
Official URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5994375
Deposited by: Memoria Investigacion
Deposited on: 12 Dec 2012 17:51
Last Modified: 21 Apr 2016 12:14
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