High frequency high-order Rayleigh modes in ZnO/GaAs

Pedrós Ayala, Jorge and García-Gancedo, Luis and Ford, C.J.B. and Barnes, C.H. and Griffiths, J.P. and Jones, G.A.C. and Flewitt, A.J. and Calle Gómez, Fernando (2011). High frequency high-order Rayleigh modes in ZnO/GaAs. In: "2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum (FCS)", 02/05/2011 - 05/05/2011, San Francisco, EEUU. ISBN 978-1-61284-111-3. pp..

Description

Title: High frequency high-order Rayleigh modes in ZnO/GaAs
Author/s:
  • Pedrós Ayala, Jorge
  • García-Gancedo, Luis
  • Ford, C.J.B.
  • Barnes, C.H.
  • Griffiths, J.P.
  • Jones, G.A.C.
  • Flewitt, A.J.
  • Calle Gómez, Fernando
Item Type: Presentation at Congress or Conference (Article)
Event Title: 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum (FCS)
Event Dates: 02/05/2011 - 05/05/2011
Event Location: San Francisco, EEUU
Title of Book: Proceedings of 2011 Joint Conference of the IEEE International Frequency Control and the European Frequency and Time Forum (FCS)
Date: 2011
ISBN: 978-1-61284-111-3
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Ingeniería Electrónica
Creative Commons Licenses: Recognition - No derivative works - Non commercial

Full text

[img]
Preview
PDF - Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (389kB) | Preview

Abstract

Strong high-order Rayleigh or Sezawa modes, in addition to the fundamental Rayleigh mode, have been observed in ZnO/GaAs(001) systems along the [110] propagation direction of GaAs. The dispersion of the different acoustic waves has been calculated and compared to the experimental data. The bandwidth and impedance matching characteristics of the multimode SAW delay lines operating at high frequencies (2.5-3.5 GHz regime) have been investigated.

More information

Item ID: 12924
DC Identifier: http://oa.upm.es/12924/
OAI Identifier: oai:oa.upm.es:12924
Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5977836
Deposited by: Memoria Investigacion
Deposited on: 12 Dec 2012 16:44
Last Modified: 16 Apr 2015 13:51
  • Logo InvestigaM (UPM)
  • Logo GEOUP4
  • Logo Open Access
  • Open Access
  • Logo Sherpa/Romeo
    Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
  • Logo Dulcinea
    Check whether the spanish journal in which you have published an article allows you to also publish it under open access.
  • Logo de Recolecta
  • Logo del Observatorio I+D+i UPM
  • Logo de OpenCourseWare UPM