Analysis of the Mechanical Properties of Multicrystalline and Monocrystalline Silicon Wafers Manufactured by Casting Methods

Barredo Egusquiza, Josu and Hermanns, Lutz Karl Heinz and Fraile de Lerma, Alberto and Miranda, Miguel and Guerrero, Ismael and Parra, Vicente (2011). Analysis of the Mechanical Properties of Multicrystalline and Monocrystalline Silicon Wafers Manufactured by Casting Methods. In: "5th International Workshop on Crystalline Silicon solar Cells", 01/11/2011 - 03/11/2011, Boston, MA, EEUU. pp..

Description

Title: Analysis of the Mechanical Properties of Multicrystalline and Monocrystalline Silicon Wafers Manufactured by Casting Methods
Author/s:
  • Barredo Egusquiza, Josu
  • Hermanns, Lutz Karl Heinz
  • Fraile de Lerma, Alberto
  • Miranda, Miguel
  • Guerrero, Ismael
  • Parra, Vicente
Item Type: Presentation at Congress or Conference (Article)
Event Title: 5th International Workshop on Crystalline Silicon solar Cells
Event Dates: 01/11/2011 - 03/11/2011
Event Location: Boston, MA, EEUU
Title of Book: Proceedings of 5th International Workshop on Crystalline Silicon solar Cells
Date: 2011
Subjects:
Faculty: E.T.S.I. Industriales (UPM)
Department: Mecánica Estructural y Construcciones Industriales [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

Full text

[img]
Preview
PDF - Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (3MB) | Preview

Abstract

Quasi-monocrystalline silicon wafers have appeared as a critical innovation in the PV industry, joining the most favourable characteristics of the conventional substrates: the higher solar cell efficiencies of monocrystalline Czochralski-Si (Cz-Si) wafers and the lower cost and the full square-shape of the multicrystalline ones. However, the quasi-mono ingot growth can lead to a different defect structure than the typical Cz-Si process. Thus, the properties of the brand-new quasi-mono wafers, from a mechanical point of view, have been for the first time studied, comparing their strength with that of both Cz-Si mono and typical multicrystalline materials. The study has been carried out employing the four line bending test and simulating them by means of FE models. For the analysis, failure stresses were fitted to a three-parameter Weibull distribution. High mechanical strength was found in all the cases. The low quality quasi-mono wafers, interestingly, did not exhibit critical strength values for the PV industry, despite their noticeable density of extended defects.

More information

Item ID: 13152
DC Identifier: http://oa.upm.es/13152/
OAI Identifier: oai:oa.upm.es:13152
Deposited by: Memoria Investigacion
Deposited on: 29 Nov 2012 12:23
Last Modified: 21 Apr 2016 12:27
  • Logo InvestigaM (UPM)
  • Logo GEOUP4
  • Logo Open Access
  • Open Access
  • Logo Sherpa/Romeo
    Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
  • Logo Dulcinea
    Check whether the spanish journal in which you have published an article allows you to also publish it under open access.
  • Logo de Recolecta
  • Logo del Observatorio I+D+i UPM
  • Logo de OpenCourseWare UPM