Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation

Peña Rodríguez, Ovidio Y.; Manzano Santamaría, Javier; Olivares, J.; Rivera de Mena, Antonio y Agullo Lopez, Fernando (2012). Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation. "Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms", v. 277 ; pp. 126-130. ISSN 0167-5087. https://doi.org/10.1016/j.nimb.2011.12.057.

Descripción

Título: Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation
Autor/es:
  • Peña Rodríguez, Ovidio Y.
  • Manzano Santamaría, Javier
  • Olivares, J.
  • Rivera de Mena, Antonio
  • Agullo Lopez, Fernando
Tipo de Documento: Artículo
Título de Revista/Publicación: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Fecha: Abril 2012
Volumen: 277
Materias:
Palabras Clave Informales: Ion irradiation; Ion damage; Swift heavy ions; Silica; Spectroscopic ellipsometry
Escuela: E.T.S.I. Industriales (UPM)
Departamento: Ingeniería Nuclear [hasta 2014]
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

Texto completo

[img]
Vista Previa
PDF (Document Portable Format) - Se necesita un visor de ficheros PDF, como GSview, Xpdf o Adobe Acrobat Reader
Descargar (2MB) | Vista Previa

Resumen

The refractive index changes induced by swift ion-beam irradiation in silica have been measured either by spectroscopic ellipsometry or through the effective indices of the optical modes propagating through the irradiated structure. The optical response has been analyzed by considering an effective homogeneous medium to simulate the nanostructured irradiated system consisting of cylindrical tracks, associated to the ion impacts, embedded into a virgin material. The role of both, irradiation fluence and stopping power, has been investigated. Above a certain electronic stopping power threshold (∼2.5 keV/nm), every ion impact creates an axial region around the trajectory with a fixed refractive index (around n = 1.475) corresponding to a certain structural phase that is independent of stopping power. The results have been compared with previous data measured by means of infrared spectroscopy and small-angle X-ray scattering; possible mechanisms and theoretical models are discussed.

Más información

ID de Registro: 15629
Identificador DC: http://oa.upm.es/15629/
Identificador OAI: oai:oa.upm.es:15629
Identificador DOI: 10.1016/j.nimb.2011.12.057
URL Oficial: http://www.sciencedirect.com/science/article/pii/S0168583X11011761
Depositado por: Memoria Investigacion
Depositado el: 09 Dic 2013 18:10
Ultima Modificación: 30 May 2017 16:05
  • Open Access
  • Open Access
  • Sherpa-Romeo
    Compruebe si la revista anglosajona en la que ha publicado un artículo permite también su publicación en abierto.
  • Dulcinea
    Compruebe si la revista española en la que ha publicado un artículo permite también su publicación en abierto.
  • Recolecta
  • e-ciencia
  • Observatorio I+D+i UPM
  • OpenCourseWare UPM