Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation

Peña Rodríguez, Ovidio Y. and Manzano Santamaría, Javier and Olivares, J. and Rivera de Mena, Antonio and Agullo Lopez, Fernando (2012). Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation. "Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms", v. 277 ; pp. 126-130. ISSN 0167-5087. https://doi.org/10.1016/j.nimb.2011.12.057.

Description

Title: Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation
Author/s:
  • Peña Rodríguez, Ovidio Y.
  • Manzano Santamaría, Javier
  • Olivares, J.
  • Rivera de Mena, Antonio
  • Agullo Lopez, Fernando
Item Type: Article
Título de Revista/Publicación: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Date: April 2012
Volume: 277
Subjects:
Freetext Keywords: Ion irradiation; Ion damage; Swift heavy ions; Silica; Spectroscopic ellipsometry
Faculty: E.T.S.I. Industriales (UPM)
Department: Ingeniería Nuclear [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

The refractive index changes induced by swift ion-beam irradiation in silica have been measured either by spectroscopic ellipsometry or through the effective indices of the optical modes propagating through the irradiated structure. The optical response has been analyzed by considering an effective homogeneous medium to simulate the nanostructured irradiated system consisting of cylindrical tracks, associated to the ion impacts, embedded into a virgin material. The role of both, irradiation fluence and stopping power, has been investigated. Above a certain electronic stopping power threshold (∼2.5 keV/nm), every ion impact creates an axial region around the trajectory with a fixed refractive index (around n = 1.475) corresponding to a certain structural phase that is independent of stopping power. The results have been compared with previous data measured by means of infrared spectroscopy and small-angle X-ray scattering; possible mechanisms and theoretical models are discussed.

More information

Item ID: 15629
DC Identifier: http://oa.upm.es/15629/
OAI Identifier: oai:oa.upm.es:15629
DOI: 10.1016/j.nimb.2011.12.057
Official URL: http://www.sciencedirect.com/science/article/pii/S0168583X11011761
Deposited by: Memoria Investigacion
Deposited on: 09 Dec 2013 18:10
Last Modified: 30 May 2017 16:05
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