Sub-bandgap spectral photo-response analysis of Ti supersaturated Si

García Hemme, Eric and García Hernansanz, Rodrigo and Olea Ariza, Javier and Pastor Pastor, David and Prado Millán, Alvaro del and Mártil de la Plaza, Ignacio and González Díaz, Germán (2012). Sub-bandgap spectral photo-response analysis of Ti supersaturated Si. "Applied Physics Letters", v. 101 (n. 19); pp.. ISSN 0003-6951. https://doi.org/10.1063/1.4766171.

Description

Title: Sub-bandgap spectral photo-response analysis of Ti supersaturated Si
Author/s:
  • García Hemme, Eric
  • García Hernansanz, Rodrigo
  • Olea Ariza, Javier
  • Pastor Pastor, David
  • Prado Millán, Alvaro del
  • Mártil de la Plaza, Ignacio
  • González Díaz, Germán
Item Type: Article
Título de Revista/Publicación: Applied Physics Letters
Date: November 2012
ISSN: 0003-6951
Volume: 101
Subjects:
Freetext Keywords: deep levels, electrical conductivity, electron-hole Recombination, elemental semiconductors, melting, metal-insulator transition, optical constants, photoconductivity, pulsed laser deposition, silicon
Faculty: Instituto de Energía Solar (IES) (UPM)
Department: Otro
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

We have analyzed the increase of the sheet conductance (ΔG□) under spectral illumination in high dose Ti implanted Si samples subsequently processed by pulsed-laser melting. Samples with Ti concentration clearly above the insulator-metal transition limit show a remarkably high ΔG□, even higher than that measured in a silicon reference sample. This increase in the ΔG□ magnitude is contrary to the classic understanding of recombination centers action and supports the lifetime recovery predicted for concentrations of deep levels above the insulator-metal transition.

More information

Item ID: 16081
DC Identifier: http://oa.upm.es/16081/
OAI Identifier: oai:oa.upm.es:16081
DOI: 10.1063/1.4766171
Official URL: http://apl.aip.org/resource/1/applab/v101/i19/p192101_s1
Deposited by: Memoria Investigacion
Deposited on: 20 Jul 2013 09:37
Last Modified: 21 Apr 2016 16:25
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