Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis

Jimenez Rey, D. and Peña Rodríguez, Ovidio Y. and Manzano Santamaría, Javier and Olivares, J. and Muñoz Martín, Ángel and Rivera de Mena, Antonio and Agullo Lopez, Fernando (2012). Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis. "Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms", v. 286 ; pp. 282-286. ISSN 0168-583x. https://doi.org/10.1016/j.nimb.2011.12.025.

Description

Title: Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis
Author/s:
  • Jimenez Rey, D.
  • Peña Rodríguez, Ovidio Y.
  • Manzano Santamaría, Javier
  • Olivares, J.
  • Muñoz Martín, Ángel
  • Rivera de Mena, Antonio
  • Agullo Lopez, Fernando
Item Type: Article
Título de Revista/Publicación: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Date: September 2012
ISSN: 0168-583x
Volume: 286
Subjects:
Freetext Keywords: Ion irradiation; Ion damage; Swift heavy ions; SiO2; Silica; Quartz
Faculty: E.T.S.I. Industriales (UPM)
Department: Ingeniería Nuclear [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Ionoluminescence (IL) of the two SiO2 phases, amorphous silica and crystalline quartz, has been comparatively investigated in this work, in order to learn about the structural defects generated by means of ion irradiation and the role of crystalline order on the damage processes. Irradiations have been performed with Cl at 10 MeV and Br at 15 MeV, corresponding to the electronic stopping regime (i.e., where the electronic stopping power Se is dominant) and well above the amorphization threshold. The light-emission kinetics for the two main emission bands, located at 1.9 eV (652 nm) and 2.7 eV (459 nm), has been measured under the same ion irradiation conditions as a function of fluence for both, silica and quartz. The role of electronic stopping power has been also investigated and discussed within current views for electronic damage. Our experiments provide a rich phenomenological background that should help to elucidate the mechanisms responsible for light emission and defect creation.

More information

Item ID: 16179
DC Identifier: http://oa.upm.es/16179/
OAI Identifier: oai:oa.upm.es:16179
DOI: 10.1016/j.nimb.2011.12.025
Official URL: http://www.sciencedirect.com/science/article/pii/S0168583X11011414
Deposited by: Memoria Investigacion
Deposited on: 14 Jan 2014 19:44
Last Modified: 30 May 2017 16:05
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