Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis

Jimenez Rey, D.; Peña Rodríguez, Ovidio Y.; Manzano Santamaría, Javier; Olivares, J.; Muñoz Martín, Ángel; Rivera de Mena, Antonio y Agullo Lopez, Fernando (2012). Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis. "Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms", v. 286 ; pp. 282-286. ISSN 0168-583x. https://doi.org/10.1016/j.nimb.2011.12.025.

Descripción

Título: Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis
Autor/es:
  • Jimenez Rey, D.
  • Peña Rodríguez, Ovidio Y.
  • Manzano Santamaría, Javier
  • Olivares, J.
  • Muñoz Martín, Ángel
  • Rivera de Mena, Antonio
  • Agullo Lopez, Fernando
Tipo de Documento: Artículo
Título de Revista/Publicación: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Fecha: Septiembre 2012
Volumen: 286
Materias:
Palabras Clave Informales: Ion irradiation; Ion damage; Swift heavy ions; SiO2; Silica; Quartz
Escuela: E.T.S.I. Industriales (UPM)
Departamento: Ingeniería Nuclear [hasta 2014]
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

Ionoluminescence (IL) of the two SiO2 phases, amorphous silica and crystalline quartz, has been comparatively investigated in this work, in order to learn about the structural defects generated by means of ion irradiation and the role of crystalline order on the damage processes. Irradiations have been performed with Cl at 10 MeV and Br at 15 MeV, corresponding to the electronic stopping regime (i.e., where the electronic stopping power Se is dominant) and well above the amorphization threshold. The light-emission kinetics for the two main emission bands, located at 1.9 eV (652 nm) and 2.7 eV (459 nm), has been measured under the same ion irradiation conditions as a function of fluence for both, silica and quartz. The role of electronic stopping power has been also investigated and discussed within current views for electronic damage. Our experiments provide a rich phenomenological background that should help to elucidate the mechanisms responsible for light emission and defect creation.

Más información

ID de Registro: 16179
Identificador DC: http://oa.upm.es/16179/
Identificador OAI: oai:oa.upm.es:16179
Identificador DOI: 10.1016/j.nimb.2011.12.025
URL Oficial: http://www.sciencedirect.com/science/article/pii/S0168583X11011414
Depositado por: Memoria Investigacion
Depositado el: 14 Ene 2014 19:44
Ultima Modificación: 30 May 2017 16:05
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