Accelerated life test of high luminosity AlGaInP LEDs

Vázquez López, Manuel and Nogueira Díaz, Eduardo and Mateos, J. (2012). Accelerated life test of high luminosity AlGaInP LEDs. "Microelectronics Reliability", v. 52 (n. 9-10); pp. 1853-1858. ISSN 0026-2714. https://doi.org/10.1016/j.microrel.2012.06.125.

Description

Title: Accelerated life test of high luminosity AlGaInP LEDs
Author/s:
  • Vázquez López, Manuel
  • Nogueira Díaz, Eduardo
  • Mateos, J.
Item Type: Article
Título de Revista/Publicación: Microelectronics Reliability
Date: September 2012
ISSN: 0026-2714
Volume: 52
Subjects:
Faculty: E.U.I.T. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Specific tests to assess reliability of high luminosity AlInGaP LED for outdoor applications are needed. In this paper tests to propose a model involving three parameters: temperature, humidity and current have been carried out. Temperature, humidity and current accelerated model has been proposed to evaluate the reliability of this type of LED. Degradation and catastrophic failure mechanisms have been analyzed. Finally we analyze the effect of serial resistance in power luminosity degradation.

More information

Item ID: 16229
DC Identifier: http://oa.upm.es/16229/
OAI Identifier: oai:oa.upm.es:16229
DOI: 10.1016/j.microrel.2012.06.125
Official URL: http://www.sciencedirect.com/science/article/pii/S0026271412003228
Deposited by: Memoria Investigacion
Deposited on: 18 Nov 2013 20:13
Last Modified: 21 Apr 2016 16:32
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