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Barredo Egusquiza, Josu and Fraile de Lerma, Alberto and Alarcón Álvarez, Enrique (2005). Study of the brittle fracture of monocrystalline silicon wafers. In: "Tenth International Conference on Civil, Structural and Environmental Engineering Computing", 30/08/2005 - 02/09/2005, Roma, Italy. pp. 1-12. https://doi.org/10.4203/ccp.81.104.
Title: | Study of the brittle fracture of monocrystalline silicon wafers |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | Tenth International Conference on Civil, Structural and Environmental Engineering Computing |
Event Dates: | 30/08/2005 - 02/09/2005 |
Event Location: | Roma, Italy |
Title of Book: | Tenth International Conference on Civil, Structural and Environmental Engineering Computing |
Date: | 2005 |
Subjects: | |
Freetext Keywords: | Four line bending test, finite elements, large displacement, monocrystalline silicon wafer, cleavage plane, size effect |
Faculty: | E.T.S.I. Industriales (UPM) |
Department: | Mecánica Estructural y Construcciones Industriales [hasta 2014] |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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There is a growing trend towards using thinner wafers in order to reduce the costs of solar energy. But the current tools employed during the solar cells production are not prepared to work with thinner wafers, decreasing the industrial yield due to the high number of wafers broken. To develop new tools, or modify existing ones, the mechanical properties have to be determined. This paper tackles an experimental study of the mechanical properties of wafers. First, the material characteristics are detailed and the process to obtain wafers is presented. Then, the complete test setup and the mechanical strength results interpreted by a described numerical model are shown.
Item ID: | 19359 |
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DC Identifier: | http://oa.upm.es/19359/ |
OAI Identifier: | oai:oa.upm.es:19359 |
DOI: | 10.4203/ccp.81.104 |
Official URL: | http://www.ctresources.info/ccp/paper.html?id=267 |
Deposited by: | Memoria Investigacion |
Deposited on: | 02 Feb 2014 11:24 |
Last Modified: | 21 Apr 2016 17:37 |