Mechanical characterization of multicrystalline silicon wafers

Tejado Garrido, Elena María and Orellana Pérez, T. and Pastor Caño, Jose Ignacio and Funke, V.C. and Fütterer, W. (2012). Mechanical characterization of multicrystalline silicon wafers. In: "4th International Congress on Ceramics (ICC4)", 15/07/2012 - 19/07/2012, Chicago, Estados Unidos. p. 1.

Description

Title: Mechanical characterization of multicrystalline silicon wafers
Author/s:
  • Tejado Garrido, Elena María
  • Orellana Pérez, T.
  • Pastor Caño, Jose Ignacio
  • Funke, V.C.
  • Fütterer, W.
Item Type: Presentation at Congress or Conference (Poster)
Event Title: 4th International Congress on Ceramics (ICC4)
Event Dates: 15/07/2012 - 19/07/2012
Event Location: Chicago, Estados Unidos
Title of Book: Proceedings of 4th International Congress on Ceramics (ICC4)
Date: July 2012
Subjects:
Freetext Keywords: silicon wafers, wafer breakage, mechanical properties, impurities
Faculty: E.T.S.I. Caminos, Canales y Puertos (UPM)
Department: Ciencia de los Materiales
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

The possibility of using more economical silicon feedstock, i.e. as support for epitaxial solar cells, is of interest when the cost reduction and the properties are attractive. We have investigated the mechanical behavior of two blocks of upgraded metallurgical silicon, which is known to present high content of impurities even after being purified by the directional solidification process. The impurities are mainly metals like Al and silicon compounds. Thus, it is important to characterize their effect in order to improve cell performance and to ensure the survival of the wafers throughout the solar value chain. Microstructure and mechanical properties were studied by means of ring on ring and three point bending tests. Additionally, Young’s modulus, hardness and fracture toughness were measured. These results showed that it is possible to obtain marked improvements in toughness when impurities act as microscopic internal crack arrestors. However, the same impurities can be initiators of damage due to residual thermal stresses introduced during the crystallization process.

More information

Item ID: 19606
DC Identifier: http://oa.upm.es/19606/
OAI Identifier: oai:oa.upm.es:19606
Official URL: http://ceramics.org/4th-international-congress-on-ceramics-icc4
Deposited by: Memoria Investigacion
Deposited on: 19 Dec 2013 09:46
Last Modified: 24 Sep 2018 07:45
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