1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance

Izpura Torres, José Ignacio (2008). 1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance. "IEEE Transactions on Instrumentation and Measurement", v. 57 (n. 3); pp. 509-517. ISSN 0018-9456. https://doi.org/10.1109/TIM.2007.911642.

Description

Title: 1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance
Author/s:
  • Izpura Torres, José Ignacio
Item Type: Article
Título de Revista/Publicación: IEEE Transactions on Instrumentation and Measurement
Date: March 2008
Volume: 57
Subjects:
Freetext Keywords: backgating noise capacitor electrical noise floating conducting layer instrumental disturbance planar resistors thermal equilibrium thermal voltage noise
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Ingeniería Electrónica
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge's formula but also allows the design of proper shields to reduce 1/f noise.

More information

Item ID: 2038
DC Identifier: http://oa.upm.es/2038/
OAI Identifier: oai:oa.upm.es:2038
DOI: 10.1109/TIM.2007.911642
Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4447379&arnumber=4413160&count=26&index=6
Deposited by: Memoria Investigacion
Deposited on: 04 Jan 2010 09:04
Last Modified: 20 Apr 2016 11:50
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