Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation

Agullo Lopez, Fernando and Olivares, J. and Rivera de Mena, Antonio and Peña Rodríguez, Ovidio Y. and Manzano-Santamaría, J. and Crespillo Almenara, Miguel (2012). Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation. In: "2º Workshop Programa TechnoFusión", 18/06/2012 - 19/06/2012, Madrid, España. pp. 1-11.

Description

Title: Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation
Author/s:
  • Agullo Lopez, Fernando
  • Olivares, J.
  • Rivera de Mena, Antonio
  • Peña Rodríguez, Ovidio Y.
  • Manzano-Santamaría, J.
  • Crespillo Almenara, Miguel
Item Type: Presentation at Congress or Conference (Article)
Event Title: 2º Workshop Programa TechnoFusión
Event Dates: 18/06/2012 - 19/06/2012
Event Location: Madrid, España
Title of Book: 2º Workshop Programa TechnoFusión
Date: June 2012
Subjects:
Faculty: Instituto de Fusión Nuclear (UPM)
Department: Otro
Creative Commons Licenses: Recognition - No derivative works - Non commercial

Full text

[img] PDF - Users in campus UPM only - Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (1MB)

Abstract

The Centro de Micro-Análisis de Materiales (CMAM) in the Universidad Autónoma de Madrid is carrying out an extensive research program on the processes induced by high energy heavy mass ions (SHI) on dielectric materials and their photonic applications [1?21]. A significant part of this activity constitutes a relevant contribution to the scientific program associated to the TECHNOFUSION project. It is performed in collaboration with the Instituto de Fusion Nuclear at the UPM, the CIEMAT, the Departamento de Física de Materiales at UAM and several other national institutions (INTA) and international laboratories (GANIL, France), Legnaro Italy, Grenoble?. The program has led to a large number of publications in reputed international journals.

More information

Item ID: 20457
DC Identifier: http://oa.upm.es/20457/
OAI Identifier: oai:oa.upm.es:20457
Official URL: http://programa-technofusion.ciemat.es/TECHNOFUSIONportal/portal.do
Deposited by: Memoria Investigacion
Deposited on: 05 Nov 2013 19:39
Last Modified: 30 May 2017 16:09
  • Logo InvestigaM (UPM)
  • Logo GEOUP4
  • Logo Open Access
  • Open Access
  • Logo Sherpa/Romeo
    Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
  • Logo Dulcinea
    Check whether the spanish journal in which you have published an article allows you to also publish it under open access.
  • Logo de Recolecta
  • Logo del Observatorio I+D+i UPM
  • Logo de OpenCourseWare UPM