Study of the effect of different hole sizes on mechanical strength of wafers for back contact solar cells

Cereceda, Eneko and Barredo Egusquiza, Josu and Gutiérrez, J.R. and Jimeno, Juan Carlos and Fraile de Lerma, Alberto and Hermanns, Lutz Karl Heinz (2012). Study of the effect of different hole sizes on mechanical strength of wafers for back contact solar cells. In: "38th IEEE Photovoltaic Specialists Conference (PVSC)", 03/06/2012 - 08/06/2012, Austin, Texas. pp. 209-212. https://doi.org/10.1109/PVSC.2012.6317602.

Description

Title: Study of the effect of different hole sizes on mechanical strength of wafers for back contact solar cells
Author/s:
  • Cereceda, Eneko
  • Barredo Egusquiza, Josu
  • Gutiérrez, J.R.
  • Jimeno, Juan Carlos
  • Fraile de Lerma, Alberto
  • Hermanns, Lutz Karl Heinz
Item Type: Presentation at Congress or Conference (Article)
Event Title: 38th IEEE Photovoltaic Specialists Conference (PVSC)
Event Dates: 03/06/2012 - 08/06/2012
Event Location: Austin, Texas
Title of Book: 38th IEEE Photovoltaic Specialists Conference (PVSC)
Date: 2012
Subjects:
Faculty: E.T.S.I. Industriales (UPM)
Department: Mecánica Estructural y Construcciones Industriales [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Drilling process on wafers to produce EWT or MWT solar cells is a critical fabrication step, which affects on their mechanical stability. The amount of damage introduced during drilling process depends on the density of holes, their size and the chemical process applied afterwards. To quantify the relation between size of the holes and reduction of mechanical strength, several sets of wafers have been prepared, with different hole diameter. The mechanical strength of these sets has been measured by the ring on ring bending test, and the stress state in the moment of failure has been deduced by FE simulation.

More information

Item ID: 20459
DC Identifier: http://oa.upm.es/20459/
OAI Identifier: oai:oa.upm.es:20459
DOI: 10.1109/PVSC.2012.6317602
Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6317602&tag=1
Deposited by: Memoria Investigacion
Deposited on: 25 Feb 2014 17:56
Last Modified: 21 Apr 2016 23:17
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