Characterization of a Mo/Au thermometer for ATHENA

Parra Borderías, Maria and Fernández Martínez, Ivan and Fábrega, Lourdes and Camón, Agustin and Gil, Oscar and Costa Krämer, Jose L. and Gonzalez Arrabal, Raquel and Sesé, Javier and Bueno, Juan and Briones Fernández-Pola, Fernando (2013). Characterization of a Mo/Au thermometer for ATHENA. "IEEE Transactions on Applied Superconductivity", v. 23 (n. 3); pp. 1-5. ISSN 1051-8223.


Title: Characterization of a Mo/Au thermometer for ATHENA
  • Parra Borderías, Maria
  • Fernández Martínez, Ivan
  • Fábrega, Lourdes
  • Camón, Agustin
  • Gil, Oscar
  • Costa Krämer, Jose L.
  • Gonzalez Arrabal, Raquel
  • Sesé, Javier
  • Bueno, Juan
  • Briones Fernández-Pola, Fernando
Item Type: Article
Título de Revista/Publicación: IEEE Transactions on Applied Superconductivity
Date: 2013
Volume: 23
Freetext Keywords: Proximity effect, radiation detectors, transition edge sensors
Faculty: Instituto de Energía Solar (IES) (UPM)
Department: Otro
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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The first dark characterization of a thermometer fabricated with our Mo/Au bilayers to be used as a transition edge sensor is presented. High-quality, stress-free Mo layers, whose thickness is used to tune the critical temperature (TC ) down to 100 mK, are deposited by sputtering at room temperature (RT ) on Si3N4 bulk and membranes, and protected from degradation with a 15-nm sputtered Au layer. An extra layer of high-quality Au is deposited by ex situ e-beam to ensure low residual resistance. The thermometer is patterned on a membrane using standard photolithographic techniques and wet etching processes, and is contacted through Mo paths, displaying a sharp superconducting transition (α ≈ 600). Results show a good coupling between Mo and Au layers and excellent TC reproducibility, allowing to accurately correlate dM o and TC . Since dAu is bigger than ξM for all analyzed samples, bilayer residual resistance can be modified without affecting TC . Finally, first current to voltage measurements at different temperatures are measured and analyzed, obtaining the corresponding characterization parameters.

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Item ID: 25854
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Deposited by: Memoria Investigacion
Deposited on: 21 Sep 2014 08:19
Last Modified: 22 Sep 2014 11:38
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