Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT)

Espinet González, Pilar and Algora del Valle, Carlos and Nuñez Mendoza, Neftali and Orlando Carrillo, Vincenzo and Vázquez López, Manuel and Bautista Villares, Jesus and Araki, Kenji (2013). Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT). In: "9th International Conference on Concentrator Photovoltaic Systems", 15/04/2013 - 17/04/2013, Miyazaki, Japan. pp. 222-225. https://doi.org/10.1063/1.4822236.

Description

Title: Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT)
Author/s:
  • Espinet González, Pilar
  • Algora del Valle, Carlos
  • Nuñez Mendoza, Neftali
  • Orlando Carrillo, Vincenzo
  • Vázquez López, Manuel
  • Bautista Villares, Jesus
  • Araki, Kenji
Item Type: Presentation at Congress or Conference (Article)
Event Title: 9th International Conference on Concentrator Photovoltaic Systems
Event Dates: 15/04/2013 - 17/04/2013
Event Location: Miyazaki, Japan
Title of Book: AIP Conference Proceedings
Título de Revista/Publicación: 9TH INTERNATIONAL CONFERENCE ON CONCENTRATOR PHOTOVOLTAIC SYSTEMS (CPV-9)
Date: 2013
ISSN: 0094-243X
Volume: 1556
Subjects:
Freetext Keywords: Accelerated life test, ALT, reliability, concentration, multijunction, solar cells, III-V, CPV, Photovoltaics
Faculty: Instituto de Energía Solar (IES) (UPM)
Department: Otro
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

A temperature accelerated life test on commercial concentrator lattice-matched GaInP/GaInAs/Ge triple-junction solar cells has been carried out. The solar cells have been tested at three different temperatures: 119, 126 and 164 °C and the nominal photo-current condition (820 X) has been emulated by injecting current in darkness. All the solar cells have presented catastrophic failures. The failure distributions at the three tested temperatures have been fitted to an Arrhenius-Weibull model. An Arrhenius activation energy of 1.58 eV was determined from the fit. The main reliability functions and parameters (reliability function, instantaneous failure rate, mean time to failure, warranty time) of these solar cells at the nominal working temperature (80 °C) have been obtained. The warranty time obtained for a failure population of 5 % has been 69 years. Thus, a long-term warranty could be offered for these particular solar cells working at 820 X, 8 hours per day at 80 °C.

More information

Item ID: 26156
DC Identifier: http://oa.upm.es/26156/
OAI Identifier: oai:oa.upm.es:26156
DOI: 10.1063/1.4822236
Deposited by: Memoria Investigacion
Deposited on: 01 Jun 2014 07:11
Last Modified: 22 Sep 2014 11:40
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