Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT)

Espinet González, Pilar; Algora del Valle, Carlos; Nuñez Mendoza, Neftali; Orlando Carrillo, Vincenzo; Vázquez López, Manuel; Bautista Villares, Jesus y Araki, Kenji (2013). Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT). En: "9th International Conference on Concentrator Photovoltaic Systems", 15/04/2013 - 17/04/2013, Miyazaki, Japan. pp. 222-225. https://doi.org/10.1063/1.4822236.

Descripción

Título: Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT)
Autor/es:
  • Espinet González, Pilar
  • Algora del Valle, Carlos
  • Nuñez Mendoza, Neftali
  • Orlando Carrillo, Vincenzo
  • Vázquez López, Manuel
  • Bautista Villares, Jesus
  • Araki, Kenji
Tipo de Documento: Ponencia en Congreso o Jornada (Artículo)
Título del Evento: 9th International Conference on Concentrator Photovoltaic Systems
Fechas del Evento: 15/04/2013 - 17/04/2013
Lugar del Evento: Miyazaki, Japan
Título del Libro: AIP Conference Proceedings
Título de Revista/Publicación: 9TH INTERNATIONAL CONFERENCE ON CONCENTRATOR PHOTOVOLTAIC SYSTEMS (CPV-9)
Fecha: 2013
Volumen: 1556
Materias:
Palabras Clave Informales: Accelerated life test, ALT, reliability, concentration, multijunction, solar cells, III-V, CPV, Photovoltaics
Escuela: Instituto de Energía Solar (IES) (UPM)
Departamento: Otro
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

A temperature accelerated life test on commercial concentrator lattice-matched GaInP/GaInAs/Ge triple-junction solar cells has been carried out. The solar cells have been tested at three different temperatures: 119, 126 and 164 °C and the nominal photo-current condition (820 X) has been emulated by injecting current in darkness. All the solar cells have presented catastrophic failures. The failure distributions at the three tested temperatures have been fitted to an Arrhenius-Weibull model. An Arrhenius activation energy of 1.58 eV was determined from the fit. The main reliability functions and parameters (reliability function, instantaneous failure rate, mean time to failure, warranty time) of these solar cells at the nominal working temperature (80 °C) have been obtained. The warranty time obtained for a failure population of 5 % has been 69 years. Thus, a long-term warranty could be offered for these particular solar cells working at 820 X, 8 hours per day at 80 °C.

Más información

ID de Registro: 26156
Identificador DC: http://oa.upm.es/26156/
Identificador OAI: oai:oa.upm.es:26156
Identificador DOI: 10.1063/1.4822236
Depositado por: Memoria Investigacion
Depositado el: 01 Jun 2014 07:11
Ultima Modificación: 22 Sep 2014 11:40
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