Analysis of germanium epiready wafers for III-V heteroepitaxy

Rey-Stolle Prado, Ignacio and Barrigón Montañés, Enrique and Galiana Blanco, Beatriz and Algora del Valle, Carlos (2008). Analysis of germanium epiready wafers for III-V heteroepitaxy. "Journal of Crystal Growth", v. 310 (n. 23); pp. 4803-4807. ISSN 0022-0248.


Title: Analysis of germanium epiready wafers for III-V heteroepitaxy
  • Rey-Stolle Prado, Ignacio
  • Barrigón Montañés, Enrique
  • Galiana Blanco, Beatriz
  • Algora del Valle, Carlos
Item Type: Article
Título de Revista/Publicación: Journal of Crystal Growth
Date: November 2008
Volume: 310
Freetext Keywords: A1. Substrates, A1. Surface processes, A3. Metalorganic vapor-phase epitaxy, B2. Semiconducting germanium.
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Frequently,whengrowing III–V semiconductors on germanium substrates, unexpected differences between nominally identical substrates are encountered. Using atomic force microscopy (AFM), we have analysed a set of germanium substrates sharing the same specifications.The substrates come from the same vendor but different results come about in terms of the morphology of the epilayers produced by the same epitaxial routine(i.e. substrateW1 produce depilayers with good morphology while substrate WX produce depilayers with defects). The morphological analysis has been carried out on(a)epiready substrates; (b)samples after a high-temperature bake at 700 1C; and(c)on the samples after a hydride (PH3) annealingat640 1C. In the two first stages all substrates(both W1 and WX) show the same good morphology with RMS roughness below A˚ in all cases. It is in the third stage(annealinginPH3) that the morphology degrades and the differences between the samples become apparent. After phosphine exposureat640 1C, the RMS roughness of both substrates approximately doubles, and their surface appears as full of peaks and valleys on the nanometer scale. Despite the general appearance of the samples being similar, a careful analysis of their surface reveals that the substrates that produce bad morphologies(WX) show higher peaks, and some of their roughness parameters, namely, surface kurtosis and the surface skewness, are considerably degraded.

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Item ID: 2725
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Deposited by: Memoria Investigacion
Deposited on: 05 Apr 2010 09:28
Last Modified: 16 Feb 2015 10:49
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