On-site tests for the detection of potential induced degradation in modules

Martinez Moreno, Francisco and Lorenzo Pigueiras, Eduardo and Muñoz Cano, Javier and Parra, R. and Espino, T. (2013). On-site tests for the detection of potential induced degradation in modules. In: "28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC)", 30/09/2013 - 04/10/2013, París, France. pp. 1-5.

Description

Title: On-site tests for the detection of potential induced degradation in modules
Author/s:
  • Martinez Moreno, Francisco
  • Lorenzo Pigueiras, Eduardo
  • Muñoz Cano, Javier
  • Parra, R.
  • Espino, T.
Item Type: Presentation at Congress or Conference (Article)
Event Title: 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC)
Event Dates: 30/09/2013 - 04/10/2013
Event Location: París, France
Title of Book: 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC)
Date: 2013
Subjects:
Freetext Keywords: PID, PV module, evaluation, electroluminescence
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

This paper presents different test alternatives which can be used on-site in a PV installation to detect potential induced degradation (PID) in modules. The testing procedures proposed are: thermal imaging; electroluminescence imaging; open circuit voltage measurements; operating voltage measurements; IV curve measurements; and dark IV curve measurements. Advantages and disadvantages of each test are reported.

More information

Item ID: 30003
DC Identifier: http://oa.upm.es/30003/
OAI Identifier: oai:oa.upm.es:30003
Deposited by: Memoria Investigacion
Deposited on: 27 Jul 2014 07:25
Last Modified: 22 Apr 2016 00:20
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