Assessment of laser peening induced effects on Ti6Al4V by non-destructive measurements

Barriuso, S. and Carreón, H. and Porro González, Juan Antonio and González-Carrasco, J. L. and Ocaña Moreno, José Luis (2013). Assessment of laser peening induced effects on Ti6Al4V by non-destructive measurements. In: "4th International Conference on Laser Peening and Related Phenomena", 06/05/2013 - 10/05/2013, Madrid. pp. 1-6.

Description

Title: Assessment of laser peening induced effects on Ti6Al4V by non-destructive measurements
Author/s:
  • Barriuso, S.
  • Carreón, H.
  • Porro González, Juan Antonio
  • González-Carrasco, J. L.
  • Ocaña Moreno, José Luis
Item Type: Presentation at Congress or Conference (Other)
Event Title: 4th International Conference on Laser Peening and Related Phenomena
Event Dates: 06/05/2013 - 10/05/2013
Event Location: Madrid
Title of Book: 4th International Conference on Laser Peening and Related Phenomena
Date: 2013
Subjects:
Faculty: E.T.S.I. Industriales (UPM)
Department: Física Aplicada a la Ingeniería Industrial [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

Full text

[img]
Preview
PDF - Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (1MB) | Preview

Abstract

Assessment of laser peening induced effects on Ti6Al4V by destructive and non-destructive techniques

More information

Item ID: 30108
DC Identifier: http://oa.upm.es/30108/
OAI Identifier: oai:oa.upm.es:30108
Deposited by: Memoria Investigacion
Deposited on: 24 Nov 2014 19:44
Last Modified: 03 Mar 2017 19:32
  • Logo InvestigaM (UPM)
  • Logo GEOUP4
  • Logo Open Access
  • Open Access
  • Logo Sherpa/Romeo
    Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
  • Logo Dulcinea
    Check whether the spanish journal in which you have published an article allows you to also publish it under open access.
  • Logo de Recolecta
  • Logo del Observatorio I+D+i UPM
  • Logo de OpenCourseWare UPM