Modeling sub-threshold slope and DIBL mismatch of sub-22nm FinFet

Royer del Barrio, Pablo and López Vallejo, Marisa (2013). Modeling sub-threshold slope and DIBL mismatch of sub-22nm FinFet. In: "8th Conference on Design of Circuits and Integrated Systems (DCIS 2013)", 27/11/2013 - 29/11/2013, San Sebastián, Spain.

Description

Title: Modeling sub-threshold slope and DIBL mismatch of sub-22nm FinFet
Author/s:
  • Royer del Barrio, Pablo
  • López Vallejo, Marisa
Item Type: Presentation at Congress or Conference (Speech)
Event Title: 8th Conference on Design of Circuits and Integrated Systems (DCIS 2013)
Event Dates: 27/11/2013 - 29/11/2013
Event Location: San Sebastián, Spain
Title of Book: 8th Conference on Design of Circuits and Integrated Systems (DCIS 2013)
Date: 2013
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Ingeniería Electrónica
Creative Commons Licenses: Recognition - No derivative works - Non commercial

Full text

[img]
Preview
PDF - Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (2MB) | Preview

Abstract

A great challenge for future information technologies is building reliable systems on top of unreliable components. Parameters of modern and future technology devices are affected by severe levels of process variability and devices will degrade and even fail during the normal lifeDme of the chip due to aging mechanisms. These extreme levels of variability are caused by the high device miniaturizaDon and the random placement of individual atoms. Variability is considered a "red brick" by the InternaDonal Technology Roadmap for Semiconductors. The session is devoted to this topic presenDng research experiences from the Spanish Network on Variability called VARIABLES. In this session a talk entlited "Modeling sub-threshold slope and DIBL mismatch of sub-22nm FinFet" was presented.

More information

Item ID: 30582
DC Identifier: http://oa.upm.es/30582/
OAI Identifier: oai:oa.upm.es:30582
Deposited by: Memoria Investigacion
Deposited on: 17 Sep 2014 19:04
Last Modified: 22 Apr 2016 00:50
  • Logo InvestigaM (UPM)
  • Logo GEOUP4
  • Logo Open Access
  • Open Access
  • Logo Sherpa/Romeo
    Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
  • Logo Dulcinea
    Check whether the spanish journal in which you have published an article allows you to also publish it under open access.
  • Logo de Recolecta
  • Logo del Observatorio I+D+i UPM
  • Logo de OpenCourseWare UPM