On the Absence of Carrier Drift in Two-Terminal Devices and the Origin of Their Lowest Resistance per Carrier RK= h/q^2

Izpura Torres, José Ignacio (2012). On the Absence of Carrier Drift in Two-Terminal Devices and the Origin of Their Lowest Resistance per Carrier RK= h/q^2. "Journal of Modern Physics", v. 3 ; pp. 762-773. ISSN 2153-120X. https://doi.org/10.4236/jmp.2012.38100.

Description

Title: On the Absence of Carrier Drift in Two-Terminal Devices and the Origin of Their Lowest Resistance per Carrier RK= h/q^2
Author/s:
  • Izpura Torres, José Ignacio
Item Type: Article
Título de Revista/Publicación: Journal of Modern Physics
Date: 2012
ISSN: 2153-120X
Volume: 3
Subjects:
Freetext Keywords: Fluctuation-Dissipation; Energy Conversion into Heat; Two-Terminal Device; Discrete Resistance; Capacitance; Shot Noise; Quantum Hall Resistance
Faculty: E.T.S.I. Aeronáuticos (UPM)
Department: Infraestructura, Sistemas Aeroespaciales y Aeropuertos [hasta 2014]
UPM's Research Group: Grupo de Microsistemas y Materiales Electrónicos (GMME-CEMDATIC)
Creative Commons Licenses: Recognition

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Abstract

After a criticism on today’s model for electrical noise in resistors, we pass to use a Quantum-compliant model based on the discreteness of electrical charge in a complex Admittance. From this new model we show that carrier drift viewed as charged particle motion in response to an electric field is unlike to occur in bulk regions of Solid-State devices where carriers react as dipoles against this field. The absence of the shot noise that charges drifting in resistors should produce and the evolution of the Phase Noise with the active power existing in the resonators of L-C oscillators, are two effects added in proof for this conduction model without carrier drift where the resistance of any two-terminal device becomes discrete and has a minimum value per carrier that is the Quantum resistance RK/(2pi)

Funding Projects

TypeCodeAcronymLeaderTitle
FP7304814RAPTADIAGUnspecifiedRapid Aptamer based diagnostics for bacterial meningitis

More information

Item ID: 32508
DC Identifier: http://oa.upm.es/32508/
OAI Identifier: oai:oa.upm.es:32508
DOI: 10.4236/jmp.2012.38100
Official URL: http://www.scirp.org/journal/jmp/
Deposited by: Profesor José Ignacio Izpura
Deposited on: 28 Oct 2014 07:25
Last Modified: 28 Oct 2014 10:49
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