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Correlating Composition and Luminescence Variations in AlInGaN epilayers
Cita
Edwards, P.R.; Martin, R.W; Bejtka, K.; O´Donnell, K.P.; Fernández-Garrido, Sergio y Calleja Pardo, Enrique (2009). Correlating Composition and Luminescence Variations in AlInGaN epilayers. En: "9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, BIAMS 2008", 29/06/2008-03/07/2008, Toledo, España. ISBN 0749-6036. https://doi.org/10.1016/j.spmi.2008.10.014.
Descripción
| Título: | Correlating Composition and Luminescence Variations in AlInGaN epilayers |
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| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, BIAMS 2008 |
| Fechas del Evento: | 29/06/2008-03/07/2008 |
| Lugar del Evento: | Toledo, España |
| Título del Libro: | Proceedings of 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, BIAMS 2008 |
| Fecha: | Abril 2009 |
| ISBN: | 0749-6036 |
| Volumen: | 45, Is |
| Materias: | |
| Escuela: | E.T.S.I. Telecomunicación (UPM) |
| Departamento: | Ingeniería Electrónica |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
Resumen
Epilayers of the quaternary alloy AlxInyGa1 x yN have been grown on GaN/sapphire templates by plasma-assisted molecular beam epitaxy. The emission properties and elemental compositions of these samples were evaluated simultaneously and intercorrelated by combining hyperspectral cathodoluminescence imaging and wavelength-dispersive X-ray mapping. Use was made of inherent variations in growth temperature across a single epilayer to study the resultant effect on the different metal fractions and luminescence emission wavelength. By examining statistical correlations in this data, the interdependence of the fractions of constituent binary compounds, together with the associated changes in emission characteristics, can be clarified without the need to grow a systematic series of samples.
Más información
| ID de Registro: | 3899 |
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| Identificador DC: | http://oa.upm.es/3899/ |
| Identificador OAI: | oai:oa.upm.es:3899 |
| Identificador DOI: | 10.1016/j.spmi.2008.10.014 |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 29 Jul 2010 08:26 |
| Ultima Modificación: | 20 Abr 2016 13:19 |
