Evaluation of device reliability based on accelerated tests

Nogueira Díaz, Eduardo and Vázquez López, Manuel and Rodríguez Cano, David (2008). Evaluation of device reliability based on accelerated tests. In: "18th European Safety and Reliability Conference (ESREL 2008)", 22/09/2008-25/09/2008, Valencia, España. ISBN 978-0-415-48513-5.

Description

Title: Evaluation of device reliability based on accelerated tests
Author/s:
  • Nogueira Díaz, Eduardo
  • Vázquez López, Manuel
  • Rodríguez Cano, David
Item Type: Presentation at Congress or Conference (Article)
Event Title: 18th European Safety and Reliability Conference (ESREL 2008)
Event Dates: 22/09/2008-25/09/2008
Event Location: Valencia, España
Title of Book: Safety, Reliability and Risk Analysis : Theory, Methods and Applications
Date: 2008
ISBN: 978-0-415-48513-5
Subjects:
Faculty: E.U.I.T. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Reliability evaluation based on degradation is very useful in systems with scarce failures. In this paper a new degradation model based on Weibull distribution is proposed. The model is applied to the degradation of Light Emitting Diodes (LEDs) under different accelerated tests. The results of these tests are in agreement with the proposed model and reliability function is evaluated.

More information

Item ID: 3903
DC Identifier: http://oa.upm.es/3903/
OAI Identifier: oai:oa.upm.es:3903
Official URL: http://www.taylorandfrancis.com/books/details/9780415485135/
Deposited by: Memoria Investigacion
Deposited on: 28 Jul 2010 11:31
Last Modified: 20 Apr 2016 13:19
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