Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers

Núñez Mendoza, Neftalí; Vázquez López, Manuel; Orlando, Vincenzo; Espinet González, Pilar y Algora del Valle, Carlos (2015). Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers. "Progress in Photovoltaics: Research and Applications", v. 23 (n. 12); pp. 1857-1866. ISSN 1099-159X. https://doi.org/10.1002/pip.2631.

Descripción

Título: Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers
Autor/es:
  • Núñez Mendoza, Neftalí
  • Vázquez López, Manuel
  • Orlando, Vincenzo
  • Espinet González, Pilar
  • Algora del Valle, Carlos
Tipo de Documento: Artículo
Título de Revista/Publicación: Progress in Photovoltaics: Research and Applications
Fecha: 2015
Volumen: 23
Materias:
Palabras Clave Informales: Reliability; qualification; multijunction solar cells; accelerated life test
Escuela: E.T.S.I. y Sistemas de Telecomunicación (UPM)
Departamento: Electrónica Física
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

An adequate qualification of concentrator photovoltaic solar cells and cell-on-carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues. Accordingly, in this paper, we propose a semi-quantitative temperature-accelerated life test to qualify solar cells and cell-on-carriers that can assure a minimum life when failure mechanisms are accelerated by temperature under emulated nominal working conditions with an activation energy >0.9 eV. A properly designed semi-quantitative accelerated life test should be able to determine if the device under test will satisfy its reliability requirements with an acceptable uncertainty level. The applicability, procedure, and design of the proposed test are detailed in the paper.

Proyectos asociados

TipoCódigoAcrónimoResponsableTítulo
Gobierno de EspañaIPT-2011-1408-420000Sin especificarMINECOSin especificar
Gobierno de EspañaTEC2011-28639-C02-01Sin especificarMINECOSin especificar
FP7295985ECOSOLEBECAR SRLElevated Concentration photovoltaic solar energy generator and fully automated machinery for high throughput manufacturing and testing
Comunidad de MadridS2013/MAE-2780Sin especificarSin especificarMADRID-PV

Más información

ID de Registro: 40422
Identificador DC: http://oa.upm.es/40422/
Identificador OAI: oai:oa.upm.es:40422
Identificador DOI: 10.1002/pip.2631
URL Oficial: http://onlinelibrary.wiley.com/doi/10.1002/pip.2631/full
Depositado por: Memoria Investigacion
Depositado el: 22 Feb 2017 19:12
Ultima Modificación: 22 Feb 2017 19:12
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