Analysis by finite element calculations of light scattering in laser-textured AZO films for PV thin-film solar cells

Canteli Pérez Caballero, David and López, José Manuel and Lauzurica Santiago, Sara and Llusca, Marta and Sánchez-Aniorte, María Isabel and Bertomeu, Joan and Morales Furió, Miguel and Molpeceres Álvarez, Carlos Luis (2015). Analysis by finite element calculations of light scattering in laser-textured AZO films for PV thin-film solar cells. "Energy Procedia" (n. 84); pp. 78-85. ISSN 1876-6102. https://doi.org/10.1016/j.egypro.2015.12.298.

Description

Title: Analysis by finite element calculations of light scattering in laser-textured AZO films for PV thin-film solar cells
Author/s:
  • Canteli Pérez Caballero, David
  • López, José Manuel
  • Lauzurica Santiago, Sara
  • Llusca, Marta
  • Sánchez-Aniorte, María Isabel
  • Bertomeu, Joan
  • Morales Furió, Miguel
  • Molpeceres Álvarez, Carlos Luis
Item Type: Article
Título de Revista/Publicación: Energy Procedia
Date: 2015
ISSN: 1876-6102
Subjects:
Freetext Keywords: Laser texturing; light management;finite element method (FEM) simulations.
Faculty: E.T.S.I. Industriales (UPM)
Department: Física Aplicada e Ingeniería de Materiales
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

In the thin-film photovoltaic industry, to achieve a high light scattering in one or more of the cell interfaces is one of the strategies that allow an enhancement of light absorption inside the cell and, therefore, a better device behavior and efficiency. Although chemical etching is the standard method to texture surfaces for that scattering improvement, laser light has shown as a new way for texturizing different materials, maintaining a good control of the final topography with a unique, clean, and quite precise process. In this work AZO films with different texture parameters are fabricated. The typical parameters used to characterize them, as the root mean square roughness or the haze factor, are discussed and, for deeper understanding of the scattering mechanisms, the light behavior in the films is simulated using a finite element method code. This method gives information about the light intensity in each point of the system, allowing the precise characterization of the scattering behavior near the film surface, and it can be used as well to calculate a simulated haze factor that can be compared with experimental measurements. A discussion of the validation of the numerical code, based in a comprehensive comparison with experimental data is included.

Funding Projects

TypeCodeAcronymLeaderTitle
Government of SpainENE2013-48629-C4-3-RHELLOUnspecifiedUnspecified
Government of SpainENE2013-48629-C4-2-RHELLOUnspecifiedUnspecified

More information

Item ID: 40782
DC Identifier: http://oa.upm.es/40782/
OAI Identifier: oai:oa.upm.es:40782
DOI: 10.1016/j.egypro.2015.12.298
Official URL: http://www.sciencedirect.com/science/article/pii/S187661021502963X
Deposited by: Memoria Investigacion
Deposited on: 06 Jun 2016 14:56
Last Modified: 05 Jun 2019 15:12
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