Analysis by finite element calculations of light scattering in laser-textured AZO films for PV thin-film solar cells

Canteli, David; López, José Manuel; Lauzurica Santiago, Sara; Llusca, Marta; Sánchez-Aniorte, María Isabel; Bertomeu, Joan; Morales Furió, Miguel y Molpeceres Álvarez, Carlos Luis (2015). Analysis by finite element calculations of light scattering in laser-textured AZO films for PV thin-film solar cells. "Energy Procedia" (n. 84); pp. 78-85. ISSN 1876-6102. https://doi.org/10.1016/j.egypro.2015.12.298.

Descripción

Título: Analysis by finite element calculations of light scattering in laser-textured AZO films for PV thin-film solar cells
Autor/es:
  • Canteli, David
  • López, José Manuel
  • Lauzurica Santiago, Sara
  • Llusca, Marta
  • Sánchez-Aniorte, María Isabel
  • Bertomeu, Joan
  • Morales Furió, Miguel
  • Molpeceres Álvarez, Carlos Luis
Tipo de Documento: Artículo
Título de Revista/Publicación: Energy Procedia
Fecha: 2015
Materias:
Palabras Clave Informales: Laser texturing; light management;finite element method (FEM) simulations.
Escuela: E.T.S.I. Industriales (UPM)
Departamento: Física Aplicada e Ingeniería de Materiales
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

In the thin-film photovoltaic industry, to achieve a high light scattering in one or more of the cell interfaces is one of the strategies that allow an enhancement of light absorption inside the cell and, therefore, a better device behavior and efficiency. Although chemical etching is the standard method to texture surfaces for that scattering improvement, laser light has shown as a new way for texturizing different materials, maintaining a good control of the final topography with a unique, clean, and quite precise process. In this work AZO films with different texture parameters are fabricated. The typical parameters used to characterize them, as the root mean square roughness or the haze factor, are discussed and, for deeper understanding of the scattering mechanisms, the light behavior in the films is simulated using a finite element method code. This method gives information about the light intensity in each point of the system, allowing the precise characterization of the scattering behavior near the film surface, and it can be used as well to calculate a simulated haze factor that can be compared with experimental measurements. A discussion of the validation of the numerical code, based in a comprehensive comparison with experimental data is included.

Proyectos asociados

TipoCódigoAcrónimoResponsableTítulo
Gobierno de EspañaENE2013-48629-C4-3-RSin especificarSin especificarSin especificar

Más información

ID de Registro: 40782
Identificador DC: http://oa.upm.es/40782/
Identificador OAI: oai:oa.upm.es:40782
Identificador DOI: 10.1016/j.egypro.2015.12.298
URL Oficial: http://www.sciencedirect.com/science/article/pii/S187661021502963X
Depositado por: Memoria Investigacion
Depositado el: 06 Jun 2016 14:56
Ultima Modificación: 21 Ago 2017 11:38
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