Accelerated life test of high luminosity blue LEDs

Nogueira Díaz, Eduardo and Orlando, Vincenzo and Ochoa Serna, Javier and Fernandez, A. and Vazquez Lopez, Manuel (2016). Accelerated life test of high luminosity blue LEDs. "Microelectronics Reliability", v. 64 ; pp. 631-634. ISSN 0026-2714. https://doi.org/10.1016/j.microrel.2016.07.021.

Description

Title: Accelerated life test of high luminosity blue LEDs
Author/s:
  • Nogueira Díaz, Eduardo
  • Orlando, Vincenzo
  • Ochoa Serna, Javier
  • Fernandez, A.
  • Vazquez Lopez, Manuel
Item Type: Article
Título de Revista/Publicación: Microelectronics Reliability
Date: 18 September 2016
Volume: 64
Subjects:
Freetext Keywords: LED, Accelerated Life Test, Life models, Reliability
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

A complete Accelerated Life Test on high luminosity blue LEDs is presented. The test was conducted at different temperatures, humidity and current conditions, involving a total of seven individual tests. Life models were obtained for the catastrophic failures of the tests and then a complete temperature, humidity and current model was developed,which enabled the calculation of the life of the LEDs for any of these conditions. Catastrophic failures and model parameters were consistent with earlier results using different high luminosity LEDs. Non-catastrophic failures were modelled with their corresponding luminous power loss on each test, with expected results.

More information

Item ID: 45997
DC Identifier: http://oa.upm.es/45997/
OAI Identifier: oai:oa.upm.es:45997
DOI: 10.1016/j.microrel.2016.07.021
Official URL: http://www.sciencedirect.com/science/article/pii/S0026271416301627
Deposited by: Memoria Investigacion
Deposited on: 24 May 2017 18:30
Last Modified: 19 Sep 2018 22:30
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