Testing solar panels for small-size satellites: the UPMSAT-2 mission

Roibas-Millan, Elena and Alonso-Moragón, Álvaro and Giménez-Mateos, Alejandro G. and Pindado Carrion, Santiago (2017). Testing solar panels for small-size satellites: the UPMSAT-2 mission. "Measurement Science and Technology", v. 28 (n. 11); p. 115801. ISSN 0957-0233. https://doi.org/10.1088/1361-6501/aa85fc.

Description

Title: Testing solar panels for small-size satellites: the UPMSAT-2 mission
Author/s:
  • Roibas-Millan, Elena
  • Alonso-Moragón, Álvaro
  • Giménez-Mateos, Alejandro G.
  • Pindado Carrion, Santiago
Item Type: Article
Título de Revista/Publicación: Measurement Science and Technology
Date: 2017
Volume: 28
Subjects:
Freetext Keywords: solar cell, solar panels testing, space power system, micro-satellites
Faculty: Instituto de Microgravedad Ignacio Da Riva (UPM)
Department: Aeronaves y Vehículos Espaciales
UPM's Research Group: Desarrollo y Ensayos Aeroespaciales DEA
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

At present, the development of small-size satellites by universities, companies and research institutions have become a usual practice, which is spread rapidly. In this kind of projects the cost play a significant role. One of the main points are the Assembly, Integration and Test (AIT) plans, which carries out an associated cost for simulating the environmental conditions. For instance, in the power subsystems test and, in particular in the solar panels testing, the irradiance and temperature conditions might be the optimum so the performances of the system are next to real operational conditions.
 To reproduce the environmental conditions in terms of irradiance, solar simulators are usually used, which carries an associated increase of cost for testing equipments. The aim of this paper is to present an alternative and unexpenssive way to perform the AIT plans on spacecraft power subsystems, from a testing campaign performed using outdoor clean-sky conditions and an isolation system to protect the panels. A post-process of the measured data is therefore needed, taking into account the conditions in which the test has been accomplished. The I-V characteristics obtained are compared with a theorical 1-diode/2-resistor equivalent electric circuit, achieving enough precision based solely in the manufacturer data.

More information

Item ID: 47979
DC Identifier: http://oa.upm.es/47979/
OAI Identifier: oai:oa.upm.es:47979
DOI: 10.1088/1361-6501/aa85fc
Official URL: http://iopscience.iop.org/article/10.1088/1361-6501/aa85fc
Deposited by: Biblioteca ETSI Aeronauticos
Deposited on: 10 Oct 2017 13:22
Last Modified: 06 Nov 2017 08:48
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