Electrophoretic versus dielectrophoretic nanoparticle patterning using optoelectronic tweezers

Muñoz Martinez, Juan Francisco; Alcazar De Velasco Rico, Angel Manuel y Ramiro Diaz, Jose Bruno (2017). Electrophoretic versus dielectrophoretic nanoparticle patterning using optoelectronic tweezers. "Physical Review Applied", v. 7 ; pp.. ISSN 2331-7019. https://doi.org/hdl.handle.net/10486/680228.

Descripción

Título: Electrophoretic versus dielectrophoretic nanoparticle patterning using optoelectronic tweezers
Autor/es:
  • Muñoz Martinez, Juan Francisco
  • Alcazar De Velasco Rico, Angel Manuel
  • Ramiro Diaz, Jose Bruno
Tipo de Documento: Artículo
Título de Revista/Publicación: Physical Review Applied
Fecha: 2017
Volumen: 7
Materias:
Escuela: E.T.S. de Ingeniería Aeronáutica y del Espacio (UPM)
Departamento: Mecánica de Fluidos y Propulsión Aeroespacial
Grupo Investigación UPM: Optoelectronic; Nanoparticle; Photovoltaic tweezers; Neutral aluminum; Física
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

Currently, there is increasing interest from many scientific disciplines in the development of systems that are able to sort and arrange many objects in parallel at the nano- and micrometric scale. Among others, photovoltaic tweezers (PVT) are an optoelectronic technique for trapping and patterning nano- and micro-objects in accordance with an arbitrary light profile. In this work, the differential features of electro- and dielectrophoretic (EP and DEP) nanoparticle (NP) patterning using PVT are deeply investigated. The study is carried out through theory and experiments. The developed theory extends the applicability of a previously reported model to be able to compute EP potentials and to obtain numerical values for the EP and DEP potential energies. Two-dimensional patterns of charged and neutral aluminum NPs are fabricated on top of Fe?LiNbO3 crystals, and different light distributions and other experimental parameters (crystal thickness and NP concentration) are compared. Patterns of charged and neutral NPs show remarkable differences in both particle density distribution and fidelity to the original light profile. The observed different features between EP and DEP trapping are satisfactorily explained by the theoretical analysis. The results provide routes for the optimization of the NP arrangements for both regimes.

Proyectos asociados

TipoCódigoAcrónimoResponsableTítulo
Gobierno de EspañaMAT2014-57704-C3Sin especificarSin especificarSin especificar

Más información

ID de Registro: 50480
Identificador DC: http://oa.upm.es/50480/
Identificador OAI: oai:oa.upm.es:50480
Identificador DOI: hdl.handle.net/10486/680228
URL Oficial: https://journals.aps.org/prapplied/abstract/10.1103/PhysRevApplied.7.064027
Depositado por: Memoria Investigacion
Depositado el: 08 Feb 2019 10:52
Ultima Modificación: 08 Feb 2019 10:52
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