Bayesian model for subpixel uncertainty determination in optical measurements

Berzal Rubio, Miguel and Gómez, E. and Vicente Oliva, Jesús de and Caja García, Jesús and Barajas Fernandez, Cintia (2017). Bayesian model for subpixel uncertainty determination in optical measurements. "Procedia Manufacturing", v. 13 ; pp. 442-449. ISSN 2351-9789. https://doi.org/10.1016/j.promfg.2017.09.042.

Description

Title: Bayesian model for subpixel uncertainty determination in optical measurements
Author/s:
  • Berzal Rubio, Miguel
  • Gómez, E.
  • Vicente Oliva, Jesús de
  • Caja García, Jesús
  • Barajas Fernandez, Cintia
Item Type: Article
Título de Revista/Publicación: Procedia Manufacturing
Date: 2017
Volume: 13
Subjects:
Freetext Keywords: subpixel approximation; bayesian probability; optical measurement; uncertainty; Monte Carlo method
Faculty: E.T.S.I. Industriales (UPM)
Department: Física Aplicada e Ingeniería de Materiales
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Uncertainty determination can be obtained by two procedures: GUM and the Monte Carlo Method. This work presents a model that helps to evaluate the uncertainty in measurements collected by optical measuring machines when using the Monte Carlo method. Initially, the model converts intensity, using Bayesian probability, from the pixel image derived from camera into a polygonal area with three to five vertexes. The outer vertexes are fitted using least squares procedures to obtain a measurand shape approximation in a subpixel range. Algorithms have been programmed and verified into Matlab using synthetic images with different triangles. Through a detailed analysis, the usefulness of a new tool, the parameter, will be demonstrated as an alternative method for estimating uncertainty of measurements of pixel images.

Funding Projects

TypeCodeAcronymLeaderTitle
Government of SpainDPI2016-78476-PUnspecifiedUnspecifiedDesarrollo colaborativo de patrones de software y estudios de trazabilidad e intercomparación en la caracterización metrológica de superficies

More information

Item ID: 53331
DC Identifier: http://oa.upm.es/53331/
OAI Identifier: oai:oa.upm.es:53331
DOI: 10.1016/j.promfg.2017.09.042
Official URL: https://www.sciencedirect.com/science/article/pii/S2351978917306777
Deposited by: Memoria Investigacion
Deposited on: 10 Jan 2019 19:27
Last Modified: 10 Jan 2019 19:27
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