Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements

Nogueira Díaz, Eduardo and Sancho Gil, Juan and Sánchez Bote, José Luis (2018). Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements. "Microelectronics Reliability", v. 81 ; pp. 95-100. ISSN 0026-2714. https://doi.org/10.1016/j.microrel.2017.12.018.

Description

Title: Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements
Author/s:
  • Nogueira Díaz, Eduardo
  • Sancho Gil, Juan
  • Sánchez Bote, José Luis
Item Type: Article
Título de Revista/Publicación: Microelectronics Reliability
Date: 2018
ISSN: 0026-2714
Volume: 81
Subjects:
Freetext Keywords: Electret microphones; Reliability; Electroacoustic degradation
Faculty: E.T.S.I. y Sistemas de Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Electronic equipment frequently utilises low cost electret microphones. In this paper, a complete accelerated lifetest on commercial electret microphones is presented using thermal chamber testing. The test was conducted on the microphones under study at three different temperatures. After each thermal probe, the electroacoustic characteristics of each transducer was analysed for obtaining the degradation model. In the literature such tests have been performed through charge losses on the electret materials. Life models were obtained for the degradation failures revealed from the tests and a complete temperature model was then developed, which can calculate the useful life of the microphones under any of these conditions.

More information

Item ID: 54859
DC Identifier: http://oa.upm.es/54859/
OAI Identifier: oai:oa.upm.es:54859
DOI: 10.1016/j.microrel.2017.12.018
Official URL: https://www.sciencedirect.com/science/article/pii/S0026271417305772?via%3Dihub
Deposited by: Memoria Investigacion
Deposited on: 20 Jan 2020 12:57
Last Modified: 20 Jan 2020 12:57
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