Determination of individual concentrator tolerances from full-array I-V curve measurements

Zamora Herranz, Pablo and Benitez Gimenez, Pablo and Miñano Dominguez, Juan Carlos and Chaves, Julio (2010). Determination of individual concentrator tolerances from full-array I-V curve measurements. In: "25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion", 06/09/2010 - 10/09/2010, Valencia, Spain. ISBN 3-936338-26-4.

Description

Title: Determination of individual concentrator tolerances from full-array I-V curve measurements
Author/s:
  • Zamora Herranz, Pablo
  • Benitez Gimenez, Pablo
  • Miñano Dominguez, Juan Carlos
  • Chaves, Julio
Item Type: Presentation at Congress or Conference (Article)
Event Title: 25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion
Event Dates: 06/09/2010 - 10/09/2010
Event Location: Valencia, Spain
Title of Book: Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion
Date: 2010
ISBN: 3-936338-26-4
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

When dealing with CPV manufacturing process, tolerances are critical in order to obtain a low cost massproduction system. Usually the efficiency attained by a whole module array is smaller than the average efficiency of every single module. This downside is due to the well-known mismatch losses introduced by the cell series connection. For this reason, we present a novel mathematical method to calculate photocurrent versus pointing angle curves for the single-cell modules, with the only information of photocurrent versus pointing angle measurements for the whole module array. In this way we can estimate the mismatch losses for a given array just by analyzing its full-array I-V curve. Thus, the great breakthrough about this method lies in no single-cell module measurement is needed. The application of this method allows the measurement of the real tolerances of any CPV system.

More information

Item ID: 7522
DC Identifier: http://oa.upm.es/7522/
OAI Identifier: oai:oa.upm.es:7522
Official URL: http://www.eupvsec-proceedings.com/proceedings?char=D&paper=9364
Deposited by: Memoria Investigacion
Deposited on: 15 Jun 2011 10:27
Last Modified: 20 Apr 2016 16:39
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