Universidad Politecnica de Madrid
Search
Navegation
User Area
About Archivo Digital UPM
Dulcinea
Sherpa Romeo
Recolecta

Comparison of Different Finite Element Models for the Simulation of the Ring-Ball on Ring Test

Barredo Egusquiza, Josu and Hermanns, Lutz Karl Heinz and Rey Llorente, Ignacio Del and Fraile de Lerma, Alberto and Alarcon Alvarez, Enrique (2010) Comparison of Different Finite Element Models for the Simulation of the Ring-Ball on Ring Test. In: 10th International Conference on Computational Structures Technology, 14/09/2010 - 17/09/2010, Valencia, España.

Ver estadisticas de descargas para este eprint (solo desde ordenadores de la UPM) Estadisticas UPM
Bookmark and Share
Item Type:Presentation at Congress or Day (Article)
Authors/Creators:
Creators NameCreators email (if known)
Barredo Egusquiza, Josu
Hermanns, Lutz Karl Heinz
Rey Llorente, Ignacio Del
Fraile de Lerma, Alberto
Alarcon Alvarez, Enrique
Title:Comparison of Different Finite Element Models for the Simulation of the Ring-Ball on Ring Test
Event Title:10th International Conference on Computational Structures Technology
Event Dates:14/09/2010 - 17/09/2010
Event Location:Valencia, España
Title of Book:Proceedings of the 10th International Conference on Computational Structures Technology
Publisher:Computational & Technology Resources
Date:2010
ISBN:9781905088362
Department:Structural Mechanics and Industrial Constructions
Faculty:E.T.S.I. Industrial (UPM)
Creative Commons licenses:Recognition - No derivative works - No commercial
Item ID:8049
Subjects:Renewable Energy

Texto completo disponible como:

[img]
Preview
PDF
1916Kb - Idioma: English

Official URL: http://www.civil-comp.com/conf/cst2010.htm

Abstract

Monocrystalline silicon wafers are widely used in photovoltaic industry. The trend towards thinner wafers leads to higher breakage rates in the production process. In this context, the characterization of the mechanical strength becomes necessary. Different fracture tests as the ring/ball on ring are carried out. This paper presents different ways to simulate these tests. Analytical methods are applied in a first step. Simplified FE models (with shell elements and an axisymmetric model) that take into account non linearities existing in the test are presented and a 3d solid model is detailed. Results in terms of calculation time, stress distribution, adjustment to the tests and fitting to a Weibull distribution are compared

Item Type:Presentation at Congress or Day (Article)
Uncontrolled Keywords:ball on ring test, monocrystalline silicon wafers, finite element model, shell elements, axisymmetry, solid elements, Weibull distribution, contact, anisotropy, large displacements.
Subjects:Renewable Energy
Código ID:8049
Depositado Por:Memoria Investigacion
Depositado el:19 Aug 2011 13:51
Last Modified:19 Aug 2011 13:51

Sólo para Personal del Archivo: editar este registro