Tunnel diode modeling, including nonlocal trap-assisted tunneling: A focus on III-V multijunction solar cell simulation

Baudrit, Mathieu and Algora del Valle, Carlos (2010). Tunnel diode modeling, including nonlocal trap-assisted tunneling: A focus on III-V multijunction solar cell simulation. "IEEE Transactions on Electron Devices", v. 57 (n. 10); pp. 2564-2571. ISSN 0018-9383. https://doi.org/10.1109/TED.2010.2061771.

Description

Title: Tunnel diode modeling, including nonlocal trap-assisted tunneling: A focus on III-V multijunction solar cell simulation
Author/s:
  • Baudrit, Mathieu
  • Algora del Valle, Carlos
Item Type: Article
Título de Revista/Publicación: IEEE Transactions on Electron Devices
Date: August 2010
ISSN: 0018-9383
Volume: 57
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Multijunction solar cells (MJCs) based on III-V semiconductors constitute the state-of-the-art approach for high-efficiency solar energy conversion. These devices, consisting of a stack of various solar cells, are interconnected by tunnel diodes. Reliable simulations of the tunnel diode behavior are still a challenge for solar cell applications. In this paper, a complete description of the model implemented in Silvaco ATLAS is shown, demonstrating the importance of local and nonlocal trap-assisted tunneling. We also explain how the measured doping profile and the metalization-induced series resistance influence the behavior of the tunnel diodes. Finally, we detail the different components of the series resistance and show that this can help extract the experimental voltage drop experienced by an MJC due to the tunnel junction. The value of this intrinsic voltage is important for achieving high efficiencies at concentrations near 1000 suns.

More information

Item ID: 8397
DC Identifier: http://oa.upm.es/8397/
OAI Identifier: oai:oa.upm.es:8397
DOI: 10.1109/TED.2010.2061771
Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5546937&tag=1
Deposited by: Memoria Investigacion
Deposited on: 25 Aug 2011 10:30
Last Modified: 20 Apr 2016 17:12
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