Novel accelerated testing method for III-V concentrator solar cells

Nuñez Mendoza, Neftali; Vázquez López, Manuel; González Ciprián, José Ramón; Algora del Valle, Carlos y Espinet González, Pilar (2010). Novel accelerated testing method for III-V concentrator solar cells. En: "21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", 11/10/2010 - 15/10/2010, Gaeta, Italia.

Descripción

Título: Novel accelerated testing method for III-V concentrator solar cells
Autor/es:
  • Nuñez Mendoza, Neftali
  • Vázquez López, Manuel
  • González Ciprián, José Ramón
  • Algora del Valle, Carlos
  • Espinet González, Pilar
Tipo de Documento: Ponencia en Congreso o Jornada (Artículo)
Título del Evento: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Fechas del Evento: 11/10/2010 - 15/10/2010
Lugar del Evento: Gaeta, Italia
Título del Libro: Microelectronics Reliability. Proceedings of the 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Fecha: Septiembre 2010
Volumen: 50, Is
Materias:
Escuela: E.T.S.I. Telecomunicación (UPM)
Departamento: Electrónica Física
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

Accelerated testing is a necessary tool in order to demonstrate the reliability of concentration photovoltaic solar cells, devices which is expected to be working not less than 25 years. Many problems arise when implementing high temperature accelerated testing in this kind of solar cells, because the high light irradiation level, at which they work, is very difficult to achieve inside a climatic chamber. This paper presents a novel accelerated testing method for concentrator solar cells, under simulated electrical working conditions (i.e. forward biasing the solar cells at the equivalent current they would handle at 700 suns), that overcomes some of the limitations found in test these devices inside the chamber. The tracked power of the solar cells to 700×, experiences a degradation of 1.69% after 4232 h, in the 130 °C test, and of 2.20% after 2000 h in the 150 °C one. An additional test has been carried out at 150 °C, increasing the current to that equivalent to 1050 suns. This last test shows a power degradation of 4% for the same time.

Más información

ID de Registro: 8406
Identificador DC: http://oa.upm.es/8406/
Identificador OAI: oai:oa.upm.es:8406
URL Oficial: http://www.sciencedirect.com/science/journal/00262714
Depositado por: Memoria Investigacion
Depositado el: 25 Ago 2011 08:41
Ultima Modificación: 26 Sep 2014 17:21
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