Novel accelerated testing method for III-V concentrator solar cells

Nuñez Mendoza, Neftali and Vázquez López, Manuel and González Ciprián, José Ramón and Algora del Valle, Carlos and Espinet González, Pilar (2010). Novel accelerated testing method for III-V concentrator solar cells. In: "21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", 11/10/2010 - 15/10/2010, Gaeta, Italia.

Description

Title: Novel accelerated testing method for III-V concentrator solar cells
Author/s:
  • Nuñez Mendoza, Neftali
  • Vázquez López, Manuel
  • González Ciprián, José Ramón
  • Algora del Valle, Carlos
  • Espinet González, Pilar
Item Type: Presentation at Congress or Conference (Article)
Event Title: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Event Dates: 11/10/2010 - 15/10/2010
Event Location: Gaeta, Italia
Title of Book: Microelectronics Reliability. Proceedings of the 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Date: September 2010
Volume: 50, Is
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Accelerated testing is a necessary tool in order to demonstrate the reliability of concentration photovoltaic solar cells, devices which is expected to be working not less than 25 years. Many problems arise when implementing high temperature accelerated testing in this kind of solar cells, because the high light irradiation level, at which they work, is very difficult to achieve inside a climatic chamber. This paper presents a novel accelerated testing method for concentrator solar cells, under simulated electrical working conditions (i.e. forward biasing the solar cells at the equivalent current they would handle at 700 suns), that overcomes some of the limitations found in test these devices inside the chamber. The tracked power of the solar cells to 700×, experiences a degradation of 1.69% after 4232 h, in the 130 °C test, and of 2.20% after 2000 h in the 150 °C one. An additional test has been carried out at 150 °C, increasing the current to that equivalent to 1050 suns. This last test shows a power degradation of 4% for the same time.

More information

Item ID: 8406
DC Identifier: http://oa.upm.es/8406/
OAI Identifier: oai:oa.upm.es:8406
Official URL: http://www.sciencedirect.com/science/journal/00262714
Deposited by: Memoria Investigacion
Deposited on: 25 Aug 2011 08:41
Last Modified: 26 Sep 2014 17:21
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