Vázquez López, Manuel and Nuñez Mendoza, Neftali and Nogueira Díaz, Eduardo and Borreguero, A. (2010) Degradation of AlInGap red LEDs under drive current and temperature accelerated life tests. In: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 11/10/2010 - 15/10/2010, Gaeta, Italia.
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| Item Type: | Presentation at Congress or Day (UNSPECIFIED) | ||||||||||
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| Title: | Degradation of AlInGap red LEDs under drive current and temperature accelerated life tests | ||||||||||
| Event Title: | 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis | ||||||||||
| Event Dates: | 11/10/2010 - 15/10/2010 | ||||||||||
| Event Location: | Gaeta, Italia | ||||||||||
| Title of Book: | Microelectronics Reliability. Proceedings of the 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis | ||||||||||
| Publisher: | Elsevier | ||||||||||
| Date: | September 2010 | ||||||||||
| Volume: | 50, Issue 9-11 | ||||||||||
| Department: | Physical Electronics | ||||||||||
| Faculty: | E.U.I.T. Telecommunication (UPM) | ||||||||||
| Creative Commons licenses: | Recognition - No derivative works - No commercial | ||||||||||
| Item ID: | 8407 | ||||||||||
| Subjects: | Telecommunications Physics |
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| PDF 523Kb - Idioma: English |
Official URL: http://www.sciencedirect.com/science/journal/00262714
Abstract
AlInGaP LEDs are widely used in illumination applications as automotive and signalization due their low consumption and high durability. In order to verify the high durability data it is necessary to consider not only catastrophic failures but also degradation. In this work LEDs degradation at different temperature and drive current accelerated tests have been analyzed. In all the tests we have carried out an exponential degradation trend have been observed. Temperature and drive current influence in degradation rate and reliability have been evaluated.
| Item Type: | Presentation at Congress or Day (UNSPECIFIED) |
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| Subjects: | Telecommunications Physics |
| Código ID: | 8407 |
| Depositado Por: | Memoria Investigacion |
| Depositado el: | 25 Aug 2011 10:02 |
| Last Modified: | 25 Aug 2011 10:31 |
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