Export: Accelerated life test of high luminosity AlGaInP LEDs

Vázquez López, Manuel and Nogueira Díaz, Eduardo and Mateos, J. (2012). Accelerated life test of high luminosity AlGaInP LEDs. "Microelectronics Reliability", v. 52 (n. 9-10); pp. 1853-1858. ISSN 0026-2714. https://doi.org/10.1016/j.microrel.2012.06.125.

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