Export: Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation
Agullo Lopez, Fernando and Olivares, J. and Rivera de Mena, Antonio and Peña Rodríguez, Ovidio Y. and Manzano-Santamaría, J. and Crespillo Almenara, Miguel (2012). Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation. In: "2º Workshop Programa TechnoFusión", 18/06/2012 - 19/06/2012, Madrid, España. pp. 1-11.
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