Export: Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation

Agullo Lopez, Fernando and Olivares, J. and Rivera de Mena, Antonio and Peña Rodríguez, Ovidio Y. and Manzano-Santamaría, J. and Crespillo Almenara, Miguel (2012). Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation. In: "2º Workshop Programa TechnoFusión", 18/06/2012 - 19/06/2012, Madrid, España. pp. 1-11.

Please select an output format:

  • Logo InvestigaM (UPM)
  • Logo GEOUP4
  • Logo Open Access
  • Open Access
  • Logo Sherpa/Romeo
    Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
  • Logo Dulcinea
    Check whether the spanish journal in which you have published an article allows you to also publish it under open access.
  • Logo de Recolecta
  • Logo del Observatorio I+D+i UPM
  • Logo de OpenCourseWare UPM