Export: Uncertainty in ellipse fitting using a flatbed scanner: development and experimental verification

Vicente Oliva, Jesús de and Sanchez Perez, Angel M. and Berzal Rubio, Miguel and Maresca, Piera and Gomez Garcia, Emilio (2014). Uncertainty in ellipse fitting using a flatbed scanner: development and experimental verification. "Measurement Science and Technology", v. 25 (n. 1); pp. 1-10. ISSN 0957-0233. https://doi.org/10.1088/0957-0233/25/1/015005.

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