Export: Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies

López Escalante, María Cruz and Gabás Pérez, María Mercedes and García Vara, Iván and Barrigón Montañés, Enrique and Rey-Stolle Prado, Ignacio and Algora del Valle, Carlos and Palanco López, Santiago and Ramos Barrado, José Ramón (2015). Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies. "Applied Surface Science", v. 360 (n. B); pp. 477-484. ISSN 0169-4332. https://doi.org/10.1016/j.apsusc.2015.10.098.

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