Export: Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model

Espinet González, Pilar and Algora del Valle, Carlos and González Ciprián, José Ramón and Nuñez Mendoza, Neftali and Vázquez López, Manuel (2010). Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model. "Microelectronics Reliability", v. 50 (n. 9-11); pp. 1875-1879. ISSN 0026-2714. https://doi.org/10.1016/j.microrel.2010.07.128.

Please select an output format:

  • Logo InvestigaM (UPM)
  • Logo GEOUP4
  • Logo Open Access
  • Open Access
  • Logo Sherpa/Romeo
    Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
  • Logo Dulcinea
    Check whether the spanish journal in which you have published an article allows you to also publish it under open access.
  • Logo de Recolecta
  • Logo del Observatorio I+D+i UPM
  • Logo de OpenCourseWare UPM