Number of items: 3.
Article
Espinet González, Pilar and Algora del Valle, Carlos and González Ciprián, José Ramón and Nuñez Mendoza, Neftali and Vázquez López, Manuel (2010) Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model. Microelectronics Reliability, 50 (9-11). pp. 1875-1879. ISSN 0026-2714
Presentation at Congress or Day
González Ciprián, José Ramón and Vázquez López, Manuel and Nuñez Mendoza, Neftali and Algora del Valle, Carlos and Espinet González, Pilar (2010) Reliability Improvement in III-V Concentrator Solar Cells by Means of Perimeter Protection. In: 6th International Conference on Concentrating Photovoltaic Systems, 07/04/2010 - 09/04/2010, Friburgo, Alemania.
Nuñez Mendoza, Neftali and Vázquez López, Manuel and González Ciprián, José Ramón and Algora Del Valle, Carlos and Espinet González, Pilar (2010) Novel accelerated testing method for III-V concentrator solar cells. In: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 11/10/2010 - 15/10/2010, Gaeta, Italia.
This list was generated on Sat May 26 15:44:26 2012 CEST.
