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Beinik, I. and Galiana, B. and Kratzer, M. and Teichert, C. and Rey-Stolle Prado, Ignacio and Algora del Valle, Carlos and Tejedor, P. (2010) Nanoscale electrical characterization of arrowhead defects in GalnP thin films grown on Ge. Journal of Vacuum Science and Technology B, 28 (4). C5G5-C5G10. ISSN 1071-1023

This list was generated on Sat May 26 00:35:00 2012 CEST.

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