Items where Author is "Teichert, C."

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Article

Beinik, I. and Galiana Blanco, Beatriz and Kratzer, M. and Teichert, C. and Rey-Stolle Prado, Ignacio and Algora del Valle, Carlos and Tejedor, P. (2010). Nanoscale electrical characterization of arrowhead defects in GalnP thin films grown on Ge. "Journal of Vacuum Science and Technology B", v. 28 (n. 4); pp.. ISSN 1071-1023. https://doi.org/10.1116/1.3454373.

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