Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

Consoli Barone, Antonio (2011). Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers. "Optics Express", v. 20 (n. 5); pp. 4979-4987. ISSN 1094-4087. https://doi.org/10.1364/OE.20.004979.

Description

Title: Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers
Author/s:
  • Consoli Barone, Antonio
Item Type: Article
Título de Revista/Publicación: Optics Express
Date: 2011
ISSN: 1094-4087
Volume: 20
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Tecnología Fotónica [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

A new method for measuring the linewidth enhancement factor (α-parameter) of semiconductor lasers is proposed and discussed. The method itself provides an estimation of the measurement error, thus self-validating the entire procedure. The α-parameter is obtained from the temporal profile and the instantaneous frequency (chirp) of the pulses generated by gain switching. The time resolved chirp is measured with a polarization based optical differentiator. The accuracy of the obtained values of the α-parameter is estimated from the comparison between the directly measured pulse spectrum and the spectrum reconstructed from the chirp and the temporal profile of the pulse. The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than ± 8%.

More information

Item ID: 12166
DC Identifier: https://oa.upm.es/12166/
OAI Identifier: oai:oa.upm.es:12166
DOI: 10.1364/OE.20.004979
Deposited by: Memoria Investigacion
Deposited on: 05 Sep 2012 10:45
Last Modified: 21 Apr 2016 11:22
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