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XPS as Characterization Tool for PV: From the Substrate to Complete III-V Multijunction Solar Cells
Citation
Gabás, M. and López-Escalante, M.C. and Algora del Valle, Carlos and Rey-Stolle Prado, Ignacio and Barrigón Montañés, Enrique and García Vara, Iván and Galiana Blanco, Beatriz and Palanco, S. and Bijani, S. and Ramos-Barrado, J.R. (2011). XPS as Characterization Tool for PV: From the Substrate to Complete III-V Multijunction Solar Cells. In: "37th IEEE Photovoltaic Specialists Conference, PVSC-2011", 19/06/2011 - 24/06/2011, Seattle, EEUU. ISBN 978-1-4244-9966-3. pp. 229-233.
Description
| Title: | XPS as Characterization Tool for PV: From the Substrate to Complete III-V Multijunction Solar Cells |
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| Author/s: |
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| Item Type: | Presentation at Congress or Conference (Article) |
| Event Title: | 37th IEEE Photovoltaic Specialists Conference, PVSC-2011 |
| Event Dates: | 19/06/2011 - 24/06/2011 |
| Event Location: | Seattle, EEUU |
| Title of Book: | Proceedings of the 37th IEEE Photovoltaic Specialists Conference, PVSC-2011 |
| Date: | 2011 |
| ISBN: | 978-1-4244-9966-3 |
| Subjects: | |
| Faculty: | E.T.S.I. Telecomunicación (UPM) |
| Department: | Electrónica Física |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
This contribution aims to illustrate the potential of the X-ray photoelectron spectroscopy (XPS) technique as a tool to analyze different parts of a solar cell (surface state, heterointerfaces, profile composition of ohmic contacts, etc). Here, the analysis is specifically applied to III-V multijunction solar cells used in concentrator systems. The information provided from such XPS analysis has helped to understand the physico-chemical nature of these surfaces and interfaces, and thus has guided the technological process in order to improve the solar cell performance.
More information
| Item ID: | 12522 |
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| DC Identifier: | https://oa.upm.es/12522/ |
| OAI Identifier: | oai:oa.upm.es:12522 |
| Official URL: | http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6177424 |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 07 Aug 2012 10:00 |
| Last Modified: | 23 Feb 2015 16:02 |
