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Poveda-Villalón, María and Suárez-Figueroa, Mari Carmen and Gómez-Pérez, A. (2012). Did you validate your ontology? OOPS!. In: "9ª Extended Semantic Web Conference (ESWC2012)", 27 - 31 May, 2012, Heraklion, Grecia.
Title: | Did you validate your ontology? OOPS! |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Poster) |
Event Title: | 9ª Extended Semantic Web Conference (ESWC2012) |
Event Dates: | 27 - 31 May, 2012 |
Event Location: | Heraklion, Grecia |
Title of Book: | 9ª Extended Semantic Web Conference (ESWC2012) |
Date: | May 2012 |
Subjects: | |
Freetext Keywords: | pitfalls, bad practices, ontology evaluation, ontology engineering |
Faculty: | Facultad de Informática (UPM) |
Department: | Inteligencia Artificial |
UPM's Research Group: | oeg |
Creative Commons Licenses: | None |
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The application of methodologies for building ontologies can im-prove ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. Sev-eral authors have provided lists of typical anomalies detected in ontologies dur-ing the last decade. In this context, our aim in this paper is to describe OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.
Item ID: | 14478 |
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DC Identifier: | https://oa.upm.es/14478/ |
OAI Identifier: | oai:oa.upm.es:14478 |
Deposited by: | Dr Oscar Corcho |
Deposited on: | 13 Feb 2013 12:12 |
Last Modified: | 27 Oct 2015 07:41 |