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Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation
Citation
Peña Rodríguez, Ovidio Y., Manzano Santamaría, Javier, Olivares, J., Rivera de Mena, Antonio 
ORCID: https://orcid.org/0000-0002-8484-5099 and Agullo Lopez, Fernando
(2012).
Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation.
"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms", v. 277
;
pp. 126-130.
ISSN 0167-5087.
https://doi.org/10.1016/j.nimb.2011.12.057.
Description
| Title: | Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation |
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| Author/s: |
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| Item Type: | Article |
| Título de Revista/Publicación: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
| Date: | April 2012 |
| ISSN: | 0167-5087 |
| Volume: | 277 |
| Subjects: | |
| Freetext Keywords: | Ion irradiation; Ion damage; Swift heavy ions; Silica; Spectroscopic ellipsometry |
| Faculty: | E.T.S.I. Industriales (UPM) |
| Department: | Ingeniería Nuclear [hasta 2014] |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
The refractive index changes induced by swift ion-beam irradiation in silica have been measured either by spectroscopic ellipsometry or through the effective indices of the optical modes propagating through the irradiated structure. The optical response has been analyzed by considering an effective homogeneous medium to simulate the nanostructured irradiated system consisting of cylindrical tracks, associated to the ion impacts, embedded into a virgin material. The role of both, irradiation fluence and stopping power, has been investigated. Above a certain electronic stopping power threshold (∼2.5 keV/nm), every ion impact creates an axial region around the trajectory with a fixed refractive index (around n = 1.475) corresponding to a certain structural phase that is independent of stopping power. The results have been compared with previous data measured by means of infrared spectroscopy and small-angle X-ray scattering; possible mechanisms and theoretical models are discussed.
More information
| Item ID: | 15629 |
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| DC Identifier: | https://oa.upm.es/15629/ |
| OAI Identifier: | oai:oa.upm.es:15629 |
| DOI: | 10.1016/j.nimb.2011.12.057 |
| Official URL: | http://www.sciencedirect.com/science/article/pii/S... |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 09 Dec 2013 18:10 |
| Last Modified: | 30 May 2017 16:05 |
