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Jimenez Rey, D., Peña Rodríguez, Ovidio Y., Manzano Santamaría, Javier, Olivares, J., Muñoz Martín, Ángel, Rivera de Mena, Antonio ORCID: https://orcid.org/0000-0002-8484-5099 and Agullo Lopez, Fernando
(2012).
Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis.
"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms", v. 286
;
pp. 282-286.
ISSN 0168-583x.
https://doi.org/10.1016/j.nimb.2011.12.025.
Title: | Ionoluminescence induced by swift heavy ions in silica and quartz: a comparative analysis |
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Author/s: |
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Item Type: | Article |
Título de Revista/Publicación: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
Date: | September 2012 |
ISSN: | 0168-583x |
Volume: | 286 |
Subjects: | |
Freetext Keywords: | Ion irradiation; Ion damage; Swift heavy ions; SiO2; Silica; Quartz |
Faculty: | E.T.S.I. Industriales (UPM) |
Department: | Ingeniería Nuclear [hasta 2014] |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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Ionoluminescence (IL) of the two SiO2 phases, amorphous silica and crystalline quartz, has been comparatively investigated in this work, in order to learn about the structural defects generated by means of ion irradiation and the role of crystalline order on the damage processes. Irradiations have been performed with Cl at 10 MeV and Br at 15 MeV, corresponding to the electronic stopping regime (i.e., where the electronic stopping power Se is dominant) and well above the amorphization threshold. The light-emission kinetics for the two main emission bands, located at 1.9 eV (652 nm) and 2.7 eV (459 nm), has been measured under the same ion irradiation conditions as a function of fluence for both, silica and quartz. The role of electronic stopping power has been also investigated and discussed within current views for electronic damage. Our experiments provide a rich phenomenological background that should help to elucidate the mechanisms responsible for light emission and defect creation.
Item ID: | 16179 |
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DC Identifier: | https://oa.upm.es/16179/ |
OAI Identifier: | oai:oa.upm.es:16179 |
DOI: | 10.1016/j.nimb.2011.12.025 |
Official URL: | http://www.sciencedirect.com/science/article/pii/S... |
Deposited by: | Memoria Investigacion |
Deposited on: | 14 Jan 2014 19:44 |
Last Modified: | 30 May 2017 16:05 |