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Accelerated life test of high luminosity AlGaInP LEDs
Citation
Vázquez López, Manuel and Nogueira Díaz, Eduardo and Mateos, J. (2012). Accelerated life test of high luminosity AlGaInP LEDs. "Microelectronics Reliability", v. 52 (n. 9-10); pp. 1853-1858. ISSN 0026-2714. https://doi.org/10.1016/j.microrel.2012.06.125.
Description
| Title: | Accelerated life test of high luminosity AlGaInP LEDs |
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| Author/s: |
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| Item Type: | Article |
| Título de Revista/Publicación: | Microelectronics Reliability |
| Date: | September 2012 |
| ISSN: | 0026-2714 |
| Volume: | 52 |
| Subjects: | |
| Faculty: | E.U.I.T. Telecomunicación (UPM) |
| Department: | Electrónica Física |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
Specific tests to assess reliability of high luminosity AlInGaP LED for outdoor applications are needed. In this paper tests to propose a model involving three parameters: temperature, humidity and current have been carried out. Temperature, humidity and current accelerated model has been proposed to evaluate the reliability of this type of LED. Degradation and catastrophic failure mechanisms have been analyzed. Finally we analyze the effect of serial resistance in power luminosity degradation.
More information
| Item ID: | 16229 |
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| DC Identifier: | https://oa.upm.es/16229/ |
| OAI Identifier: | oai:oa.upm.es:16229 |
| DOI: | 10.1016/j.microrel.2012.06.125 |
| Official URL: | http://www.sciencedirect.com/science/article/pii/S0026271412003228 |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 18 Nov 2013 20:13 |
| Last Modified: | 21 Apr 2016 16:32 |
